Optical rejection photonic structures

Abstract

An integrated device and related instruments and systems for analyzing samples in parallel are described. The integrated device may include sample wells arranged on a surface of where individual sample wells are configured to receive a sample labeled with at least one fluorescent marker configured to emit emission light in response to excitation light. The integrated device may further include photodetectors positioned in a layer of the integrated device, where one or more photodetectors are positioned to receive a photon of emission light emitted from a sample well. The integrated device further includes one or more photonic structures positioned between the sample wells and the photodetectors, where the one or more photonic structures are configured to attenuate the excitation light relative to the emission light such that a signal generated by the one or more photodetectors indicates detection of photons of emission light.

What is claimed is: 
     
         1 . An integrated device comprising:
 a plurality of sample wells arranged on a first layer of the integrated device, wherein individual sample wells of the plurality of sample wells are configured to receive a sample labeled with at least one fluorescent marker configured to emit emission light in response to excitation light;   a plurality of photodetectors arranged on a second layer of the integrated device and positioned to receive photons of emission light emitted from the plurality of sample wells, wherein individual sample wells of the plurality of sample wells align with at least one photodetector of the plurality of photodetectors; and   at least one photonic structure positioned between an individual sample well and its respective at least one photodetector, the at least one photonic structure configured to attenuate the excitation light relative to the emission light, wherein a signal generated by the at least one photodetector indicates detection of photons of emission light.