Noise-independent loss characterization of networks
Abstract
An S-parameter of a reference impedance is determined and converted to a desired mode of operation. Example modes of operation include a single-ended input output mode, a differential input output mode, and a common input output mode. The complex values of the impedance at each port as a function of frequency can be computed using the novel closed-form quadratic S-parameter equation which utilizes the concept of matched networks by setting the reflections and re-reflections to zero through S-parameter renormalization. Using the S-parameter renormalization, the insertion loss corresponding to zero reflections and re-reflections is calculated. Based on the determination of the matching impedance used to reduce the reflections and re-reflections to zero, a parameter of a circuit comprising the network may be modified to reduce noise.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method comprising:
accessing, by one or more processors, an S-parameter for a network that comprises a load; determining, based on the S-parameter, a first possible load reflection coefficient for the network and a second possible load reflection coefficient for the network, the first possible load reflection coefficient having a first magnitude greater than one, the second possible load reflection coefficient having a second magnitude less than or equal to one; selecting, by the one or more processors, the second possible load reflection coefficient as a load reflection coefficient based on the second magnitude being less than or equal to one; and based on the load reflection coefficient, modifying a circuit parameter.
2 . The method of claim 1 , further comprising:
based on the load reflection coefficient, determining a load characteristic impedance; renormalizing the S-parameter based on the load characteristic impedance; and determining, based on the renormalized S-parameter, an effective insertion loss of the network as a function of frequency.
3 . The method of claim 2 , further comprising:
determining, based on an insertion loss of the network and the effective insertion loss of the network, an effective insertion loss noise of the network.
4 . The method of claim 1 , wherein:
the accessing of the S-parameter comprises accessing the S-parameter from a vector network analyzer.
5 . The method of claim 1 , wherein:
the modifying of the circuit parameter of the network based on the load reflection coefficient comprises adjusting an impedance of a component of the network based on the load reflection coefficient.
6 . The method of claim 1 , wherein:
the modifying of the circuit parameter of the network based on the load reflection coefficient comprises adjusting an operating frequency of the network based on the load reflection coefficient.
7 . The method of claim 1 , wherein:
the modifying of the circuit parameter of the network based on the load reflection coefficient comprises modifying a transceiver of the network based on the load reflection coefficient.
8 . A system comprising:
a memory that stores instructions; and one or more processors configured by the instructions to perform operations comprising:
accessing, by one or more processors, an S-parameter for a network that comprises a load;
determining, based on the S-parameter, a first possible load reflection coefficient for the network and a second possible load reflection coefficient for the network, the first possible load reflection coefficient having a first magnitude greater than one, the second possible load reflection coefficient having a second magnitude less than or equal to one;
selecting, by the one or more processors, the second possible load reflection coefficient as a load reflection coefficient based on the second magnitude being less than or equal to one; and
based on the load reflection coefficient, modifying a circuit parameter.
9 . The system of claim 8 , wherein the operations further comprise:
based on the load reflection coefficient, determining a load characteristic impedance; renormalizing the S-parameter based on the load characteristic impedance; and determining, based on the renormalized S-parameter, an effective insertion loss of the network as a function of frequency.
10 . The system of claim 9 , wherein the operations further comprise:
determining, based on an insertion loss of the network and the effective insertion loss of the network, an effective insertion loss noise of the network.
11 . The system of claim 8 , wherein the operations further comprise:
the accessing of the S-parameter comprises accessing the S-parameter from a vector network analyzer.
12 . The system of claim 8 , wherein the operations further comprise:
the modifying of the circuit parameter of the network based on the load reflection coefficient comprises adjusting an impedance of a component of the network based on the load reflection coefficient.
13 . The system of claim 8 , wherein the operations further comprise:
the modifying of the circuit parameter of the network based on the load reflection coefficient comprises adjusting an operating frequency of the network based on the load reflection coefficient.
14 . The system of claim 8 , wherein the operations further comprise:
the modifying of the circuit parameter of the network based on the load reflection coefficient comprises modifying a transceiver of the network based on the load reflection coefficient.
15 . A non-transitory machine-readable storage medium containing instructions that, when executed by one or more processors, cause the one or more processors to perform operations comprising:
accessing, by one or more processors, an S-parameter for a network that comprises a load; determining, based on the S-parameter, a first possible load reflection coefficient for the network and a second possible load reflection coefficient for the network, the first possible load reflection coefficient having a first magnitude greater than one, the second possible load reflection coefficient having a second magnitude less than or equal to one; selecting, by the one or more processors, the second possible load reflection coefficient as a load reflection coefficient based on the second magnitude being less than or equal to one; and based on the load reflection coefficient, modifying a circuit parameter.
16 . The non-transitory machine-readable storage medium of claim 15 , wherein the operations further comprise:
based on the load reflection coefficient, determining a load characteristic impedance; renormalizing the S-parameter based on the load characteristic impedance; and determining, based on the renormalized S-parameter, an effective insertion loss of the network as a function of frequency.
17 . The non-transitory machine-readable storage medium of claim 16 , wherein the operations further comprise:
determining, based on an insertion loss of the network and the effective insertion loss of the network, an effective insertion loss noise of the network.
18 . The non-transitory machine-readable storage medium of claim 15 , wherein the operations further comprise:
the accessing of the S-parameter comprises accessing the S-parameter from a vector network analyzer.
19 . The non-transitory machine-readable storage medium of claim 15 , wherein the operations further comprise:
the modifying of the circuit parameter of the network based on the load reflection coefficient comprises adjusting an impedance of a component of the network based on the load reflection coefficient.
20 . The non-transitory machine-readable storage medium of claim 15 , wherein the operations further comprise:
the modifying of the circuit parameter of the network based on the load reflection coefficient comprises adjusting an operating frequency of the network based on the load reflection coefficient.Join the waitlist — get patent alerts
Track US2022317169A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.