Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry

Abstract

Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.

What is claimed is: 
     
         1 . An analytical instrument for the preparation, characterization and analysis of a sample, the instrument comprising:
 a cooled sample stage for positioning a sample;   a plurality of nanoparticulate beam sources positioned to deliver a beam of energetic nanoparticulates into or onto the sample, wherein the plurality of nanoparticulate beam sources comprises:
 a first nanoparticulate beam source configured to generate first nanoparticulates selected to have a first size and energy and to deposit the first nanoparticulates as a matrix on the sample, and 
 an additional nanoparticulate beam source configured to generate, independently of the first nanoparticulate beam source, second nanoparticulates selected to have a second size and energy and to deposit the second nanoparticulates as coreshell nanoparticulates as part of the matrix on the sample; 
   a first imaging beam source configured to etch fiduciary marks on the sample and to scan the sample to produce a secondary electron contrast image and to generate a map of locations of nanoparticulates on or within the sample;   a second imaging beam source configured to scan the sample according to the map to desorb exclusively from a volume on the sample defined by the nanoparticulates using the fiduciary marks; and   an analyzer configured to detect at least one of particles or photons emitted from the sample.