Adaptive sensing based on depth

Abstract

A microscope for adaptive sensing may comprise an illumination assembly, an image capture device configured to collect light from a sample illuminated by the assembly, and a processor. The processor may be configured to execute instructions which cause the microscope to capture, using the image capture device, an initial image set of the sample, identify, in response to the initial image set, an attribute of the sample, determine, in response to identifying the attribute, a three-dimensional (3D) process for sensing the sample, and generate, using the determined 3D process, an output image set comprising more than one focal plane. Various other methods, systems, and computer-readable media are also disclosed.

What is claimed is: 
     
         1 . A microscope comprising:
 an illumination assembly;   an image capture device configured to collect light from a sample illuminated by the illumination assembly; and   a processor configured to execute instructions which cause the microscope to:   capture, using the image capture device, an initial image set of the sample;   identify, by the processor in response to the initial image set, an attribute of the sample by performing analysis on the initial image set independently from a user;   determine, in response to identifying the attribute, a three-dimensional (3D) process; and   generate, using the determined 3D process, an output image set comprising more than one focal plane.   
     
     
         2 . The microscope of  claim 1 , wherein the 3D process comprises capturing one or more subsequent images of the sample using one or more illumination conditions of the illumination assembly and one or more image capture settings for the image capture device. 
     
     
         3 . The microscope of  claim 2 , wherein a number of illumination conditions for the 3D process is greater than a number of illumination conditions for capturing the initial image set. 
     
     
         4 . The microscope of  claim 2 , wherein the 3D process comprises determining a plurality of focal planes for capturing the one or more subsequent images based at least on the attribute, and the one or more illumination conditions and the one or more image capture settings correspond to the plurality of focal planes. 
     
     
         5 . The microscope of  claim 2 , wherein the one or more subsequent images are taken at one or more locations of the sample determined based at least on the attribute. 
     
     
         6 . The microscope of  claim 2 , wherein the 3D process comprises performing a 3D reconstruction of the sample based at least on a subset of images captured by the image capture device. 
     
     
         7 . The microscope of  claim 2 , wherein the 3D process comprises performing a 2.5D reconstruction of the sample based at least on a subset of images captured by the image capture device in order to generate 3D data from the sample. 
     
     
         8 . The microscope of  claim 2 , wherein the 3D process comprises performing focus stacking for the sample based at least on a subset of images captured by the image capture device. 
     
     
         9 . The microscope of  claim 8 , wherein the 3D process comprises capturing a plurality of images at a respective plurality of focal planes. 
     
     
         10 . The microscope of  claim 1 , wherein identifying the attribute comprises estimating the attribute corresponding to one or more locations of the sample. 
     
     
         11 . The microscope of  claim 1 , wherein the 3D process is performed within a threshold time from capturing the initial image set. 
     
     
         12 . The microscope of  claim 1 , wherein the attribute comprises a thickness of the sample at one or more locations of the sample. 
     
     
         13 . The microscope of  claim 1 , wherein the attribute comprises a depth of the sample at one or more locations of the sample. 
     
     
         14 . The microscope of  claim 1 , wherein the 3D process comprises capturing images at a plurality of distances between the image capture device and the sample, and a number of focal planes for the 3D process is greater than a number of distances in the plurality of distances. 
     
     
         15 . The microscope of  claim 1 , wherein capturing the initial image set comprises capturing the initial image set of the sample using a plurality of illumination conditions for illuminating the sample, and the plurality of illumination conditions comprises at least one of an illumination angle, an illumination wavelength, or an illumination pattern. 
     
     
         16 . The microscope of  claim 1 , wherein the 3D process comprises capturing one or more subsequent images of the sample using a plurality of illumination conditions for illuminating the sample, and the plurality of illumination conditions comprises at least one of an illumination angle, an illumination wavelength, or an illumination pattern. 
     
     
         17 . The microscope of  claim 1 , wherein the 3D process comprises a plurality of focus levels for adjusting the image capture device. 
     
     
         18 . The microscope of  claim 1 , wherein the attribute comprises at least one of a thickness, a density, a depth, a color, a stain structure of the sample, a distance from a lens of the image capture device, a plurality of distances between the lens of the image capture device and the sample, a plurality of focal planes of the sample in relation to the image capture device, a sample structure, a convergence value, a pattern, or a frequency determined based at least on one of color analysis, analysis of optical aberrations, computational reconstruction, pattern recognition, Fourier transformation, or light field analysis. 
     
     
         19 . The microscope of  claim 18 , wherein the sample is stained and the color analysis comprises determining the attribute for an area of the sample based at least on comparing a color or stain structure of the area with a color or stain structure of another area of the sample. 
     
     
         20 . The microscope of  claim 19 , wherein identifying the attribute comprises determining, using pattern recognition, the attribute of the sample.