US2023072729A1PendingUtilityA1
Method of manufacturing electronic device
Est. expiryMay 9, 2039(~12.8 yrs left)· nominal 20-yr term from priority
H10W 72/252H10W 90/00H10W 72/072H10W 72/20H10W 72/953H10W 72/952H10W 72/923H10W 72/07236H10W 72/241H10W 90/724H10W 72/2528H10W 72/07255H10W 72/222H10W 72/352H10H 20/0364H10H 20/857H01L 2933/0066H01L 2224/13113H01L 2224/13111H01L 2224/13109H01L 2924/13069H01L 2224/13144H01L 2924/014H01L 24/13H01L 33/62H01L 24/16H01L 2924/12041H01L 25/167H01L 24/81
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Claims
Abstract
A method of manufacturing an electronic device includes providing a substrate, forming a solder on the substrate, and bonding a diode to the substrate through the solder, wherein the solder is formed by stacking a plurality of first conductive layers and a plurality of second conductive layers alternately, and the plurality of first conductive layers and the plurality of second conductive layers include different materials.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method of manufacturing an electronic device, comprising:
providing a substrate; forming a solder on the substrate; and bonding a diode to the substrate through the solder; wherein the solder is formed by stacking a plurality of first conductive layers and a plurality of second conductive layers alternately; and wherein the plurality of first conductive layers and the plurality of second conductive layers include different materials.
2 . The method of manufacturing an electronic device of claim 1 , comprising:
forming a conductive structure on the substrate, wherein the conductive structure and the solder are mixed to form a solder alloy after a bonding process.
3 . The method of manufacturing an electronic device of claim 2 , wherein the solder alloy includes gold, tin and a metal element M.
4 . The method of manufacturing an electronic device of claim 3 , wherein the metal element M is indium or bismuth, and an atomic percentage of tin in sum of the tin and the metal element M is in a range from 60% to 90% in the solder alloy.
5 . The method of manufacturing an electronic device of claim 2 , wherein a portion of the solder does not form the solder alloy, and a portion of the conductive structure does not form the solder alloy.
6 . The method of manufacturing an electronic device of claim 5 , wherein the portion of the solder not forming the solder alloy is a layer, the portion of the conductive structure not forming the solder alloy is a first layer, and a thickness of the layer and a thickness of the first layer are different.
7 . A method of manufacturing an electronic device, comprising:
providing a diode; forming a solder on the diode; and bonding the diode to a substrate through the solder; wherein the solder is formed by stacking a plurality of first conductive layers and a plurality of second conductive layers alternately; and wherein the plurality of first conductive layers and the plurality of second conductive layers include different materials.
8 . The method of manufacturing an electronic device of claim 7 , comprising:
forming a conductive structure on the substrate, wherein the conductive structure and the solder are mixed to form a solder alloy after a bonding process.
9 . The method of manufacturing an electronic device of claim 8 , wherein the solder alloy includes gold, tin and a metal element M.
10 . The method of manufacturing an electronic device of claim 9 , wherein the metal element M is indium or bismuth, and an atomic percentage of tin in sum of the tin and the metal element M is in a range from 60% to 90% in the solder alloy.Cited by (0)
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