Systems and methods for acoustic emission monitoring of semiconductor devices

Abstract

A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V. the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.

1 . A system for monitoring and identifying states of a semiconductor device, the system comprising:
 at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V, said at least one acoustic sensor outputting at least one acoustic emission signal: and   a signal processing unit for receiving said at least one acoustic emission signal from said at least one acoustic sensor and for analyzing said at least one acoustic emission signal,   said signal processing unit providing an output based on said analyzing, said output being indicative at least of whether said at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of said semiconductor device.   
     
     
         2 . A system according to  claim 1 , wherein said normal operating state comprises a healthy state and said abnormal operating state comprises a defective state.