US2023126598A1PendingUtilityA1
Attachment of Stress Sensitive Integrated Circuit Dies
Est. expiryNov 17, 2037(~11.3 yrs left)· nominal 20-yr term from priority
Inventors:Casper Van Der AvoortWillem Frederik Adrianus BeslingRemco PijinenburgOlaf WunnickeCoen Tak
B81B 2203/0127B81B 2207/012G01L 9/0073B81B 2201/0257G01L 9/0048B81B 7/0074B81B 7/0048B81B 2207/015B81B 7/02H04R 1/04G01L 19/0654B81B 2201/0264H04R 19/04H04R 2201/003
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Claims
Abstract
In an embodiment, a semiconductor package includes a support and a stack of two or more semiconductor dies, the stack including an upper die and further including a lower die attached to the support by adhesive on a backside of the lower die, wherein the adhesive covers only part of the backside of the lower die, and wherein the adhesive has a plurality of non-contiguous regions on the backside of the lower die.
Claims
exact text as granted — not AI-modified1 . A semiconductor package comprising:
a support; and a stack of two or more semiconductor dies, the stack including an upper die and further including a lower die attached to the support by adhesive on a backside of the lower die, wherein the adhesive covers only part of the backside of the lower die, and wherein the adhesive has a plurality of non-contiguous regions on the backside of the lower die.
2 . The package of claim 1 , wherein the upper die includes a capacitive pressure sensor, and wherein the lower die includes a CMOS read-out circuit.
3 . A semiconductor package comprising:
a support; and a stack of two or more semiconductor dies, the stack including a lower die attached to the support and further including an upper die attached to the lower die by adhesive on a backside of the upper die, wherein the adhesive covers only part of the backside of the upper die, and wherein the adhesive has a plurality of non-contiguous regions on the backside of the upper die.
4 . The package of claim 3 , wherein the upper die includes a capacitive pressure sensor, and wherein the lower die includes a CMOS read-out circuit.
5 . A semiconductor package comprising:
a support; and a die attached to the support by adhesive on a backside of the die, wherein the adhesive covers only part of the backside of the die, the adhesive having two or a plurality of non-contiguous stripe-shaped regions on the backside of the die.
6 . The package of claim 5 , wherein the stripe-shaped regions of the adhesive are disposed adjacent edges of the die.
7 . The package of claim 6 , wherein the die includes a capacitive pressure sensor having a rectangular, suspended tensile membrane, and wherein the stripe-shaped regions of adhesive are oriented parallel to longer sides of the membrane.
8 . The package of claim 5 , wherein the die has a maximum thickness no greater than 250 µm.
9 . The package of claim 5 , wherein the package has a maximum height no greater than 0.8 mm.
10 . The package of claim 5 , further comprising an air channel in the adhesive, the air channel configured to allow out diffusion of water vapor.
11 . The package of claim 5 , wherein the adhesive includes a plurality of non-contiguous regions on the backside of the die at its corners.
12 . The package of claim 5 , wherein the support includes a die pad, and wherein the die is attached by the adhesive to the die pad.Join the waitlist — get patent alerts
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