Scanning infrared measurement system

Abstract

An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.

What is claimed is: 
     
         1 . A computerized microfluidic system for analyzing a component, comprising:
 a. a flow chamber containing a laminar flow of i) a reference liquid and ii) a sample liquid comprising the component in a medium;   b. an optical source configured to emit a light towards the component in the medium such that the light interacts with the component;   c. an optical detector subsystem configured to measure the interacted light after interaction with the component; and   d. a computing device communicatively coupled to the optical detector subsystem, and configured to generate outputs based on the interacted light.   
     
     
         2 . The system of  claim 1 , wherein the interacted light measured by the optical detector subsystem comprises absorbed light and scattered light. 
     
     
         3 . The system of  claim 1 , wherein the component comprises one or more concentrations of analytes. 
     
     
         4 . The system of  claim 3 , wherein the computing device is further configured to detect a position of the component in the medium. 
     
     
         5 . The system of  claim 4 , wherein the computing device is further configured to derive one or more concentration values of analytes of the component based on the position of the component in the medium. 
     
     
         6 . The system of  claim 1 , wherein the optical source is a quantum cascade laser (QCL) which emits the light of at least one wavelength. 
     
     
         7 . The system of  claim 6 , wherein the computing device is further configured to control the QCL to alter a wavelength, a power, or a combination thereof of the light. 
     
     
         8 . The system of  claim 7 , wherein the computing device is further configured to control the QCL to emit the light at one or more reference wavelengths, a peak absorption wavelength, or a combination thereof. 
     
     
         9 . The system of  claim 1 , wherein the optical source emits the light of mid-infrared or THz range; wherein the light has at least one wavelength or multiple wavelengths; and wherein a number of wavelengths can be controlled. 
     
     
         10 . The system of  claim 1 , wherein the optical detector subsystem comprises an alternating current (AC)-sensitive detector configured to measure the interacted light that is transmitted or scattered between the component and the medium at at least one wavelength. 
     
     
         11 . The system of  claim 10 , wherein the AC-coupled detector is selected from the group consisting of a photon detector, a thermal detector such as a thermopile, and a photovoltaic detector such as a cooled or uncooled InGaAs or HgCdTe detectors. 
     
     
         12 . The system of  claim 1 , wherein the optic source is a single fixed-wavelength laser capable of interrogating a specific absorption peak of the component in the medium; and wherein when the emitted light is scanned between the component and the medium, the magnitude of the change detected by the optical detector allows for calculation of a characteristic of the component in the medium. 
     
     
         13 . The system of  claim 1  further comprising a scanning system configured to scan the emitted light over the component, wherein the emitted light interacts with the component. 
     
     
         14 . The system of  claim 13 , wherein the computing system is further configured to control the scanning system to scan and descan the emitted light over the component. 
     
     
         15 . The system of  claim 1  further comprising a translation stage, wherein the flow chamber is disposed on top of the translation stage, wherein the translation stage is configured to allow for one-dimensional movement of the flow chamber. 
     
     
         16 . The system of  claim 15 , wherein the computing device is further configured to control the translational stage to move the flow chamber in-line with the light from the optical source. 
     
     
         17 . The system of  claim 1  further comprising a guiding system configured to guide the interacted light to the optical detector subsystem. 
     
     
         18 . A microfluidic system for analyzing a component, comprising:
 a. an optical source configured to emit a light towards the component such that the light interacts with the component;   b. an optical detector subsystem configured to measure the interacted light after interaction with the component;   c. a guiding system configured to guide the interacted light to the optical detector subsystem; and   d. a computing device communicatively coupled to the optical detector subsystem, and configured to generate outputs based on the interacted light.   
     
     
         19 . A method of analyzing a component, comprising:
 a. emitting a light by an optical source towards the component;   b. guiding the interacted light to an optical detector subsystem.   c. detecting the interacted light with the optical detector subsystem; and   d. generating, by an computing device communicatively coupled to the optical detector subsystem, outputs based on the interacted light.