Projector pattern

Abstract

Disclosed herein is a detector for determining a position of at least one object. The detector includes at least one projector for illuminating the object, at least one sensor element, and at least one evaluation device.

What is claimed is: 
     
         1 . A detector comprising:
 at least one projector for illuminating the object with at least one illumination pattern, wherein the illumination pattern comprises a plurality of illumination features, wherein the illumination features are spatially modulated such that the illumination features are patterned illumination features;   at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein each optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object to the detector, wherein the sensor element is configured to determine at least one reflection image;   
       wherein the illumination features are arranged in a periodic pattern equidistant in rows, wherein each of the rows of illumination features have an offset, wherein the offset of neighboring rows differ. 
     
     
         2 . The detector according to  claim 1 , wherein the projector comprises at least one light source configured for generating at least one light beam, wherein the projector comprises at least one transfer device configured for diffracting and for replicating the light beam for generating the illumination pattern comprising patterned illumination features. 
     
     
         3 . The detector according to  claim 1 , wherein the projector comprises at least one array of densely packed light sources according to a certain pattern configured for generating a cluster of light beams, wherein the projector comprises at least one transfer device for diffracting and replicating the cluster of light beams for generating the illumination pattern comprising patterned illumination features. 
     
     
         4 . The detector according to  claim 1 , wherein the sensor element and the projector are positioned such that the rows run parallel to epipolar lines. 
     
     
         5 . The detector according to  claim 1 , wherein the offset δ is 
       
         
           
             
               
                 δ 
                 = 
                 
                   a 
                   b 
                 
               
               , 
             
           
         
       
       wherein a and b are integer numbers, wherein the offset is an offset δ. 
     
     
         6 . The detector according to  claim 1 , wherein each of the patterned illumination features comprise a plurality of sub-features. 
     
     
         7 . A method of using at least one detector according to  claim 1 , the method comprising the following steps:
 Illuminating an object with at least one illumination pattern generated by the at least one projector of the detector, wherein the illumination pattern comprises a plurality of illumination features, wherein the illumination features are spatially modulated, wherein the illumination features are patterned illumination features, wherein each of the patterned illumination features comprises a plurality of sub-features, and/or wherein the illumination features are arranged in a periodic pattern equidistant in rows, wherein each of the rows of illumination features have an offset, wherein the offset of neighboring rows differ.   
     
     
         8 . The method according to  claim 7 , further comprising generating for each reflection light beam impinging on the light-sensitive areas of the optical sensors of the sensor element having the matrix of optical sensors at least one sensor signal in response to an illumination. 
     
     
         9 . The method according to  claim 8 , further comprising determining at least one reflection image by using the sensor element. 
     
     
         10 . The method according to  claim 9 , further comprising selecting at least one reflection feature of the reflection image. 
     
     
         11 . A method of using the detector according to  claim 1 , for a purpose of use, selected from the group consisting of: an entertainment application; a security application; a surveillance application; a safety application; a human-machine interface application; a logistics application; a tracking application; an outdoor application; a mobile application; a communication application; a photography application; a machine vision application; a robotics application; a quality control application; and a manufacturing application. 
     
     
         12 . A projector for illuminating an object with at least one illumination pattern, wherein the illumination pattern comprises a plurality of illumination features, wherein the illumination features are spatially modulated such that the illumination features are patterned illumination features wherein the illumination features are arranged in a periodic pattern equidistant in rows, wherein each of the rows of illumination features have an offset, wherein the offset of neighboring rows differ.