Inspection system, inspection method, program, and storage medium

Abstract

An inspection system includes an acquisition unit and a determination unit. The acquisition unit acquires an image representing a surface of an object. The determination unit performs color determination processing. The color determination processing is performed to determine a color of the surface of the object based on a plurality of conditions of reflection. The plurality of conditions of reflection are obtained from the image representing the surface of the object as acquired by the acquisition unit, and have a specular reflection component and a diffuse reflection component at respectively different ratios on the surface of the object.

1 . An inspection system comprising
 a determiner configured to determine a surface condition of an object, wherein   the determiner is configured to:
 acquire a plurality of images in which specular reflection components are dominant; 
 synthesize together the plurality of images to generate a synthetic image; and 
 determine the surface condition of the object based on the synthetic image. 
   
     
     
         2 . The inspection system of  claim 1 , wherein
 each of the plurality of partial images in which the specular reflection components are dominant is an image that is acquired on a region on an image capturing plane corresponding to a predetermined range (θ±φ) centered around an angle of reflection θ.   
     
     
         3 . The inspection system of  claim 2 , wherein
 each of the plurality of partial images in which the specular reflection components are dominant is an image that is acquired on a region on the image capturing plane where an angle of incidence of light from a light source onto a surface of the object is equal to an angle of reflection of light from the surface.   
     
     
         4 . The inspection system of  claim 3 , wherein
 the determiner is configured to acquire the plurality of partial images that are captured by displacing an image capturing device relative to the object.   
     
     
         5 . The inspection system of  claim 4 , wherein
 the plurality of partial images are obtained by capturing images of the surface of the object with a position of an identical camera changed.   
     
     
         6 . The inspection system of  claim 5 , further comprising a lighting system configured to irradiate the surface of the object with light, wherein
 the lighting system includes a lamp configured to irradiate the surface of the object with light, and   the lamp is configured to radiate white light.   
     
     
         7 . The inspection system of  claim 6 , wherein
 the determiner is configured to determine a color of the surface of the object.   
     
     
         8 . An inspection method for determining a surface condition of an object, comprising:
 a first step of acquiring a plurality of partial images in which specular reflection components are dominant;   a second step of synthesizing together the plurality of images to generate a synthetic image; and   a third step of determining the surface condition of the object based on the synthetic image.   
     
     
         9 . The inspection system of  claim 1 , further comprising a lighting system configured to irradiate the surface of the object with light, wherein
 the lighting system includes a lamp configured to irradiate the surface of the object with light, and   the lamp is configured to radiate white light.   
     
     
         10 . The inspection system of  claim 2 , further comprising a lighting system configured to irradiate the surface of the object with light, wherein
 the lighting system includes a lamp configured to irradiate the surface of the object with light, and   the lamp is configured to radiate white light.   
     
     
         11 . The inspection system of  claim 3 , further comprising a lighting system configured to irradiate the surface of the object with light, wherein
 the lighting system includes a lamp configured to irradiate the surface of the object with light, and   the lamp is configured to radiate white light.   
     
     
         12 . The inspection system of  claim 4 , further comprising a lighting system configured to irradiate the surface of the object with light, wherein
 the lighting system includes a lamp configured to irradiate the surface of the object with light, and   the lamp is configured to radiate white light.