System and Method for Generating Device Model Parameter

Abstract

A device model parameter generation system, comprises a user module, for obtaining parameter set configurations and measurement data of devices; a parameter extraction module, for performing parameter extractions on the parameter set configurations and the measurement data, to generate a parameter set; a simulation module, for performing simulations according to the parameter set configurations and the measurement data, to generate a simulation results; an analysis module, for determining whether the devices conform to a trend according to the parameter set, to generate a first determination result, and for determining whether the devices conform to a smoothness according to the first determination result and the parameter set, to generate a second determination result; and a device model parameter generation module, for generating a device model parameters according to the second determination result and the parameter set.

What is claimed is: 
     
         1 . A device model parameter generation system, comprising:
 a user module, for obtaining a plurality of parameter set configurations and a plurality of measurement data of a plurality of devices;   a parameter extraction module, coupled to the user module, for performing a plurality of parameter extractions on the plurality of parameter set configurations and the plurality of measurement data, to generate a parameter set;   a simulation module, coupled to the parameter extraction module, for performing a plurality of simulations according to the plurality of parameter set configurations and the plurality of measurement data, to generate a plurality of simulation results;   an analysis module, coupled to the parameter extraction module, for determining whether the plurality of devices conform to a trend according to the parameter set, to generate a first determination result, and for determining whether the plurality of devices conform to a smoothness according to the first determination result and the parameter set, to generate a second determination result; and   a device model parameter generation module, coupled to the analysis module, for generating a plurality of device model parameters according to the second determination result and the parameter set.   
     
     
         2 . The device model parameter generation system of  claim 1 , wherein the operation of performing the plurality of parameter extractions on the plurality of parameter set configurations and the plurality of measurement data comprises:
 (A) generating a plurality of candidate parameter sets according to a parameter set configuration in the plurality of parameter set configurations and a measurement data in the plurality of measurement data;   (B) providing the plurality of candidate parameter sets to the simulation module, and obtaining the plurality of simulation results;   (C) selecting a plurality of parameter sets from the plurality of candidate parameter sets according to the plurality of simulation results;   (D) determining whether the plurality of parameter sets meet a termination criterion, to generate a third determination result; and   (E) generating the plurality of parameter sets according to the third determination result.   
     
     
         3 . The device model parameter generation system of  claim 2 , wherein the parameter extraction module generates the plurality of parameter sets according to the plurality of parameter sets, when the third determination result indicates that the plurality of parameter sets meet the termination condition. 
     
     
         4 . The device model parameter generation system of  claim 2 , wherein the parameter extraction module performs a genetic algorithm on the plurality of parameter sets to generate the plurality of parameter sets and returns to the operation (B), when the third determination result indicates that the plurality of parameter sets do not meet the termination condition. 
     
     
         5 . The device model parameter generation system of  claim 4 , wherein the genetic algorithm comprises a crossover operation or a mutation operation. 
     
     
         6 . The device model parameter generation system of  claim 1 , wherein the analysis module determines whether the plurality of devices conform to the smoothness to generate the second determination result, when the first determination result indicates that the plurality of devices conform to the trend. 
     
     
         7 . The device model parameter generation system of  claim 6 , wherein the device model parameter generation module generates the plurality of device model parameters according to the parameter set, when the second determination result indicates that the plurality of devices conform to the smoothness. 
     
     
         8 . The device model parameter generation system of  claim 6 , wherein the analysis module returns to the parameter extraction module  210  and the parameter extraction module  210  performs the plurality of parameter extractions on the plurality of parameter set configurations and the plurality of measurement data, when the second determination result indicates that the plurality of devices do not conform to the smoothness. 
     
     
         9 . The device model parameter generation system of  claim 1 , wherein the analysis module returns to the parameter extraction module  210  and the parameter extraction module  210  performs the plurality of parameter extractions on the plurality of parameter set configurations and the plurality of measurement data, when the first determination result indicates that the plurality of devices do not conform to the trend. 
     
     
         10 . The device model parameter generation system of  claim 1 , wherein the operation of determining whether the plurality of devices conform to the trend according to the parameter set to generate the first determination result comprises:
 generating a first slope according to the plurality of measurement data, and generating the trend according to the first slope;   generating a second slope according to the plurality of devices corresponding to the plurality of simulation results, and comparing the second slope with the first slope to generate a first comparison result; and   generating the first determination result according to the first comparison result.   
     
     
         11 . The device model parameter generation system of  claim 1 , wherein the operation of determining whether the plurality of devices conform to the smoothness to generate the second determination result comprises:
 performing an interpolation operation on the plurality of devices to generate a plurality of virtual devices, and generating a plurality of third slopes according to the plurality of virtual devices;   comparing the plurality of third slopes with the first slope to generate a plurality of second comparison results; and   determining whether the plurality of devices conform to the smoothness according to the plurality of second comparison results, to generate the second determination result.   
     
     
         12 . A method of generating a device model parameter, comprising:
 obtaining a plurality of parameter set configurations and a plurality of measurement data of a plurality of devices;   performing a plurality of parameter extractions on the plurality of parameter set configurations and the plurality of measurement data, to generate a parameter set;   performing a plurality of simulations according to the plurality of parameter set configurations and the plurality of measurement data, to generate a plurality of simulation results;   determining whether the plurality of devices conform to a trend according to the parameter set, to generate a first determination result, and for determining whether the plurality of devices conform to a smoothness according to the first determination result and the parameter set, to generate a second determination result; and   generating a plurality of device model parameters according to the second determination result and the parameter set.