Systems and methods to detect rotation of a vibratory polisher

Abstract

Example systems and methods for detecting movement of a sample subject to a polishing operation in a vibratory polisher. The system includes a sample holder to secure the sample to be polished. A housing supports a platen upon which the sample holder is placed. The platen allows for movement of the sample holder during a polishing operation as the sample holder traverses a polishing fluid distributed about the platen. One or more sensors are arranged about the housing, operable to monitor movement of the sample holder on the platen relative to the housing.

What is claimed is: 
     
         1 . A system to perform a polishing operation on a sample, comprising:
 a sample holder to secure a sample to be polished;   a housing to support a platen, the platen operable to allow movement of the sample holder during a polishing operation; and   one or more sensors to monitor movement of the sample holder relative to the housing.   
     
     
         2 . The system of  claim 1 , further comprising a controller operable to receive data from the one or more sensors. 
     
     
         3 . The system of  claim 2 , wherein the controller is further operable to:
 count a number of rotations of the sample holder relative to the housing; and   determine an amount of polishing of the sample based on the number of rotations.   
     
     
         4 . The system of  claim 2 , wherein the controller is further configured to control one or more operational parameters of the system based on the number of rotations. 
     
     
         5 . The system of  claim 4 , wherein the one or more operational parameters is rotational speed of the sample. 
     
     
         6 . The system of  claim 2 , further comprising an actuator to control movement of the sample holder. 
     
     
         7 . The system of  claim 6 , wherein the controller is operable to control the actuator to adjust the rotational speed of the sample holder based on the measurements from the one or more sensors. 
     
     
         8 . The system of  claim 6 , further comprising a bowl connected to the actuator, the actuator to cause vibration of the bowl to move the sample holder. 
     
     
         9 . The system of  claim 1 , wherein the one or more sensors comprises a magnetic sensor, a Hall effect sensor, an optical sensor, an inductive sensor, or a mechanical sensor. 
     
     
         10 . The system of  claim 1 , wherein the one or more sensors are arranged in a fixed position relative to the housing or the platen, each of the one or more sensors operable to detect movement of the sample holder as they move about the platen, wherein the one or more sensors are arranged within the system, including one or more of the housing, a cover, or the platen. 
     
     
         11 . A system to perform a polishing operation on a sample, comprising:
 a sample holder to secure a sample to be polished;   a bowl to vibrate the sample holder; and   one or more sensors to monitor movement of the sample holders relative to the bowl.   
     
     
         12 . The system of  claim 11 , further comprising an actuator to control a rate of vibration of the bowl and thereby a rate of movement of the sample holder. 
     
     
         13 . The system of  claim 11 , further comprising a controller operable to:
 receive data from the one or more sensors;   count a number of rotations of the sample holder relative to the bowl; and   determine an amount of polishing of the sample based on the number of rotations.   
     
     
         14 . The system of  claim 13 , wherein the controller is further operable to:
 compare the number of rotations of the sample holder to a list of rotations corresponding to amounts of polishing; and   determine an amount of polishing of the sample based on the number of rotations.   
     
     
         15 . The system of  claim 11 , wherein the sample holder includes a sensor tag operable to be read by the one or more sensors. 
     
     
         16 . The system of  claim 11 , wherein the sample holder includes a material operable to trigger the one or more sensors. 
     
     
         17 . The system of  claim 16 , wherein the material is a ferrous metal. 
     
     
         18 . A system to perform a polishing operation on a sample, comprising:
 a sample to be polished;   a housing to support a platen, the platen operable to allow movement of the sample during a polishing operation; and   one or more sensors to monitor movement of the sample relative to the housing.   
     
     
         19 . The system of  claim 18 , further comprising a controller operable to:
 receive data from the one or more sensors;   count a number of rotations of the sample relative to the housing; and   determine an amount of polishing of the sample based on the number of rotations.   
     
     
         20 . The system of  claim 18 , further comprising a controller operable to:
 receive data from the one or more sensors; and   determine one or more characteristics of the sample based on the data, wherein the one or more characteristics include a type of sample, a color of the sample, a temperature of the sample, a consistency of the sample, or a material characteristic of the sample.