US2025022732A1PendingUtilityA1
Wafer-like sensor
Est. expiryNov 14, 2038(~12.3 yrs left)· nominal 20-yr term from priority
H10P 74/277H10P 72/0612H10P 74/207H10P 74/238H10P 72/0602H10P 72/06H10P 72/0604B32B 17/10981B32B 17/10899B32B 17/10651B32B 17/10733B32B 17/1044B32B 17/1055B32B 17/10137B32B 17/10036G05B 19/41875G05B 2219/32179H01L 22/34H01L 21/67276
65
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Claims
Abstract
A wafer-like semiconductor sensor includes a wafer-like base formed of a plurality of layers of chemically-hardened glass and an electronics module mounted to a recessed pocket in the base and containing a sensor.
Claims
exact text as granted — not AI-modified1 . A wafer-like substrate, comprising:
an upper annular layer formed of chemically-hardened glass; a lower layer formed of chemically-hardened glass; and wherein the annular upper layer is chemically bonded to the lower layer.
2 . The wafer-like substrate of claim 1 , wherein the upper annular layer has an inner perimeter defining a region configured to seat an electronics module.
3 . The wafer-like substrate of claim 1 , wherein the upper annular layer has a thickness of 0.4 mm.
4 . The wafer-like substrate of claim 1 , wherein in the lower layer has a thickness of 0.4 mm.
5 . The wafer-like substrate of claim 1 , and further comprising an opaque coating interposed between the upper annular layer and the lower layer.
6 . The wafer-like substrate of claim 1 , and further comprising an anti-shatter layer interposed between the upper annular layer and the lower layer.
7 . The wafer-like substrate of claim 1 , wherein an outer perimeter of the upper annular layer has a SEMI notch.
8 . The wafer-like substrate of claim 1 , wherein an outer perimeter of the lower layer has a SEMI notch.
9 . The wafer of claim 1 , and further including a recess having a thickness of 0.4 mm.
10 . The wafer-like substrate of claim 1 , wherein the upper annular layer is chemically bonded to the lower layer with epoxy.
11 . A method of making a wafer-like sensor, the method comprising:
providing a chemically-hardened base glass layer; providing a chemically-hardened upper annular glass layer; bonding the chemically-hardened base glass layer to the chemically-hardened annular glass layer to provide a chemically-hardened wafer-like substrate having a recessed pocket; and mounting an electronics housing within the recessed pocket.
12 . The method of claim 11 , and further comprising applying an anti-shatter layer to at least one of the chemically-hardened base glass layer and the chemically-hardened annular glass layer.
13 . The method of claim 11 , and further comprising applying an opaque coating to at least one of the chemically-hardened base glass layer and the chemically-hardened annular glass layer.
14 . The wafer-like substrate of claim 1 , wherein the upper annular layer and the lower layer form a recess.
15 . The wafer-like substrate of claim 14 , wherein the recess is positioned proximate a center of the lower layer.
16 . The wafer-like substrate of claim 14 , and further comprising a housing disposed within the recess.
17 . The wafer-like substrate of claim 16 , and further comprising a camera disposed within the housing.
18 . The wafer-like substrate of claim 16 , and further comprising a sensor disposed within the housing.
19 . The wafer-like substrate of claim 1 , wherein at least a portion of the wafer-like substrate includes a transparent portion.
20 . The wafer-like substrate of claim 19 , wherein the transparent portion is proximate a housing disposed within a recess formed by the annular layer and the lower layer.Join the waitlist — get patent alerts
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