US2025036572A1PendingUtilityA1
Method and electronic circuit for memory replacement
Assignee: KOREA ADVANCED INST SCI & TECHPriority: Jul 27, 2023Filed: Nov 16, 2023Published: Jan 30, 2025
Est. expiryJul 27, 2043(~17 yrs left)· nominal 20-yr term from priority
G11C 29/76G06F 2212/1016G06F 3/0604G06F 12/127G06F 2212/1024G06F 12/128G06F 2212/502G06F 12/123G06F 12/122G06F 12/0864G06F 12/12
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Claims
Abstract
A method and electronic circuit for memory replacement are provided. The method for memory replacement includes generating an input signal in response to an event for a memory, providing the input signal to a time-varying circuit including a plurality of time-varying devices, generating an output signal by reading a value stored in at least one time-varying device among the plurality of time-varying devices, and determining a storage space for replacement, based on the output signal.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for memory replacement, the method comprising:
generating an input signal in response to an event for a memory; providing the input signal to a time-varying circuit including a plurality of time-varying devices that correspond to a plurality of storage spaces of the memory and store values that change with time; generating an output signal by reading a value stored in at least one time-varying device among the plurality of time-varying devices; and determining a storage space for replacement from among the plurality of storage spaces of the memory, based on the output signal.
2 . The method of claim 1 , wherein the generating of the input signal comprises generating a different input signal according to the type of the event for the memory.
3 . The method of claim 1 , wherein the generating of the input signal comprises:
generating a first input signal when the event for the memory is an event in which a storage space for replacement in the memory does not need to be determined; and generating a second input signal when the event for the memory is an event in which a storage space for replacement in the memory needs to be determined.
4 . The method of claim 1 , wherein the providing of the input signal to the time-varying circuit comprises providing the input signal to the time-varying circuit such that the value stored in at least one time-varying device among the plurality of time-varying devices is changed.
5 . The method of claim 1 , wherein the providing of the input signal to the time-varying circuit comprises providing the input signal to the time-varying circuit such that the value stored in at least one time-varying device among the plurality of time-varying devices is read.
6 . The method of claim 1 , wherein the providing of the input signal to the time-varying circuit comprises providing the input signal to a time-varying device corresponding to a storage space related to the event among the plurality of storage spaces of the memory, from among the plurality of time-varying devices.
7 . The method of claim 1 , wherein the generating of the output signal comprises generating the output signal by reading values stored in two or more time-varying devices corresponding to two or more storage spaces related to the event among the plurality of storage spaces of the memory, from among the plurality of time-varying devices.
8 . The method of claim 7 , wherein the determining of the storage space for replacement comprises:
selecting one time-varying device from among the two or more time-varying devices by analyzing, based on the output signal, the values stored in the two or more time-varying devices; and determining a storage space corresponding to the selected time-varying device, from among the two or more storage spaces, as the storage space for replacement.
9 . The method of claim 8 , wherein the selecting of the one time-varying device from among the two or more time-varying devices comprises selecting one time-varying device storing a value less than a predetermined value, from among the two or more time-varying devices, based on the output signal.
10 . The method of claim 8 , wherein the selecting of the one time-varying device from among the two or more time-varying device comprises selecting one time-varying device storing a smallest value, from among the two or more time-varying devices, based on the output signal.
11 . An electronic circuit for memory replacement, the electronic circuit comprising:
an input circuit configured to generate an input signal in response to an event for a memory; a time-varying circuit configured to receive the input signal, and comprising a plurality of time-varying devices that correspond to a plurality of storage spaces of the memory and store values that change with time; an output circuit configured to generate an output signal by reading a value stored in at least one time-varying device among the plurality of time-varying devices; and a controller configured to determine a storage space for replacement from among the plurality of storage spaces of the memory, based on the output signal.
12 . The electronic circuit of claim 11 , wherein the memory comprises at least one of a register, a cache memory, and a main memory.
13 . The electronic circuit of claim 11 , wherein each of the plurality of time-varying devices comprises at least one of a memristor, dynamic random-access memory (DRAM), and static random-access memory (SRAM).
14 . The electronic circuit of claim 11 , wherein each of the plurality of time-varying devices is configured to increase a stored value as an input signal generated in response to an event in which a storage space for replacement in the memory needs to be determined is provided.
15 . A method for replacing a set-associative cache, the method comprising:
generating an input signal in response to an event for the set-associative cache; providing the input signal to a time-varying circuit including an array of time-varying devices that correspond to a plurality of lines of the set-associative cache and store values that change with time; generating an output signal by reading a value stored in at least one time-varying device in the array of time-varying devices; and determining a line for replacement from among the plurality of lines of the set-associative cache, based on the output signal.
16 . The method of claim 15 , wherein the providing of the input signal to the time-varying circuit comprises:
selecting a row and a column of the array of time-varying devices, based on an index and a way of a line related to the event from among the plurality of lines; and providing the input signal to a time-varying device in the selected row and the selected column in the array of time-varying devices.
17 . The method of claim 16 , wherein the selecting of the row and the column of the array of time-varying devices comprises:
selecting a row of the array of time-varying devices corresponding to the index of the line related to the event; and selecting a column of the array of time-varying devices corresponding to the way of the line related to the event.
18 . The method of claim 15 , wherein the generating of the output signal comprises generating the output signal by reading values stored in time-varying devices in one row in the array of time-varying devices.
19 . The method of claim 15 , wherein the generating of the output signal comprises:
selecting a row of the array of time-varying devices, based on an index of lines related to the event from among the plurality of lines; and generating the output signal by reading values stored in time-varying devices in the selected row in the array of time-varying devices.
20 . The method of claim 19 , wherein the determining of the line for replacement comprises:
selecting one time-varying device from among time-varying devices in the selected row by analyzing, based on the output signal, values stored in the time-varying devices in the selected row; and determining, as the line for replacement, a line of a way corresponding to a column of the selected time-varying device from among the lines related to the event.Join the waitlist — get patent alerts
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