Specimen processing systems and methods for holding slides

Abstract

At least some embodiments of the technology are directed to an automated slide processing apparatus configured to apply at least one reagent to a specimen carried by a microscope slide. The slide processing station can include a support element with a support surface, at least one vacuum port, and a sealing member having a non-round shape. In an uncompressed state, the sealing member can extend upwardly beyond the support surface. In a compressed state, the sealing member can be configured to maintain an airtight seal with a backside of the microscope slide as the microscope slide is pulled against the support surface by a vacuum drawn via the at least one vacuum port.

1 .- 26 . (canceled) 
     
     
         27 . A method of transporting substrates in an automated processing system, comprising:
 sequentially moving a plurality of individual substrates from a carrier to a substrate-staging device; and   for each of the individual substrates moved to the substrate-staging device,
 detecting, using a sensor, a position of the individual substrate relative to the substrate-staging device, 
 contacting sides of the individual substrate to move the individual substrate to an aligned position along the substrate-staging device, wherein the aligned position is based on output from the sensor, 
 moving a transfer head from a non-engaged position above the individual substrate to an engaged position adjacent to the individual substrate, 
 capturing the individual substrate using a capture feature of the transfer head, and 
 transporting, using the transfer head, the individual substrate from the substrate-staging device to one or more specimen processing stations. 
   
     
     
         28 . The method of  claim 27 , wherein the sensor is configured to detect a presence of the individual substrate positioned on the substrate-staging device. 
     
     
         29 . The method of  claim 27 , further comprising an alignment sensor configured to detect alignment of the transfer head with respect to the substrate-staging device. 
     
     
         30 . The method of  claim 27 , further comprising alternatingly aligning and transporting the individual substrates to sequentially load the one or more specimen processing stations with the individual substrates, and wherein the individual substrates are specimen-bearing microscope slides. 
     
     
         31 . The method of  claim 27 , further comprising contacting opposing sides of the individual substrate with pivotable aligning members of the substrate-staging device, and wherein a sealing member is configured to sealing contact a bottom surface of the individual substrate to hold the individual substrate against the substrate-staging device. 
     
     
         32 . The method of  claim 27 , wherein the sensor is a first sensor, the method further comprising a second sensor configured to detect a vacuum within a vacuum port configured to hold the individual substrate being moved to the aligned position. 
     
     
         33 . The method of  claim 27 , wherein the sensor is configured to determine when a longitudinal axis of the individual substrate is substantially aligned with a longitudinal axis of the substrate-staging device. 
     
     
         34 . The method of  claim 27 , wherein in response to output from the sensor, aligning, using an alignment mechanism, the individual substrate with respect to the aligned position. 
     
     
         35 . A method of transporting substrates in an automated processing system, comprising:
 moving an individual substrate from a carrier, which carries substrates, to a substrate-staging device, wherein the substrate-staging device has an over-travel inhibitor assembly controlled by a controller;   positioning the individual substrate at the substrate-staging device while the over-travel inhibitor assembly inhibits movement of the individual substrate past a substrate-holding region; and   transporting the individual substrate from the substrate-staging device to one or more specimen processing stations.   
     
     
         36 . The method of  claim 35 , wherein the over-travel inhibitor assembly includes
 a vacuum source, and   an over-travel inhibitor element fluidically coupled to the vacuum source and positioned to draw a vacuum between the individual substrate and the substrate-staging device.   
     
     
         37 . The method of  claim 35 , wherein the controller is programmed to control the over-travel inhibitor assembly to
 position the individual substrate along the substrate-holding region, and   allow removal of the individual substrate from the substrate-holding region.   
     
     
         38 . The method of  claim 35 , further comprising positioning the individual substrate at the substrate-staging device using an actuator controlled by the controller. 
     
     
         39 . The method of  claim 35 , wherein the over-travel inhibitor assembly includes a sensor configured to detect the individual substrate on the substrate-holding region. 
     
     
         40 . The method of  claim 35 , wherein the controller is programmed to detect a presence of the individual substrate at the substrate-staging device based on suction between the over-travel inhibitor assembly and the individual substrate. 
     
     
         41 . The method of  claim 35 , further comprising using a sensor to detect an alignment feature and activating the over-travel inhibitor assembly based on output from the sensor. 
     
     
         42 . The method of  claim 35 , further comprising contacting opposing sides of the individual substrate with pivotable alignment members of the substrate-staging device while a bottom surface of the individual substrate overlays a sealing member of the substrate-staging device. 
     
     
         43 . The method of  claim 42 , wherein a sensor is configured to ensure that the pivotable aligning members are applying a sufficient amount of force to move the substrate. 
     
     
         44 . An automated specimen processing system, comprising:
 a substrate-staging device configured to receive a microscope substrate and including
 a holding region configured to support the microscope substrate; 
 a substrate sensor; and 
 an over-travel inhibitor assembly; and 
   a controller in communication with the substrate-staging device and programmed to control the over-travel inhibitor assembly such that the over-travel inhibitor assembly inhibits movements of the microscope substrate relative to the holding region; and   a transfer head configured to carry the microscope substrate from the substrate-staging device to a specimen processing station, the transfer head having a substrate capture feature configured to
 engage an upper surface of the microscope substrate, which is supported by the holding region and positioned using the over-travel inhibitor assembly, and 
 retain the microscope substrate during transport. 
   
     
     
         45 . The automated specimen processing system of  claim 44 , wherein the controller is programmed to
 receive output from a sensor of the transfer head; and   align the transfer head with respect to the microscope substrate at the holding region based on the received output.   
     
     
         46 . The automated specimen processing system of  claim 44 , wherein the transfer head further includes alignment features that correspond to alignment features of the substrate-staging device configured to ensure proper alignment of the transfer head with respect to the microscope substrate. 
     
     
         47 . The automated specimen processing system of  claim 44 , wherein the over-travel inhibitor assembly includes at least one vacuum port and a vacuum surface surrounded by the at least one vacuum port, and wherein the vacuum surface is spaced apart from and positioned below a plane such that the vacuum surface and the microscope substrate at least partially define a vacuum chamber with a height less than a height of the at least one vacuum port. 
     
     
         48 . The automated specimen processing system of  claim 44 , wherein the over-travel inhibitor assembly is positioned to be located under a label of the microscope substrate. 
     
     
         49 . The automated specimen processing system of  claim 44 , wherein the transfer head further includes a sensor configured to detect a substrate retained by the transfer head.