Methods and apparatus to distribute workloads in server farms based on temperature

Abstract

Systems, apparatus, articles of manufacture, and methods to distribute workloads in server farms based on temperature are disclosed. An example first compute device includes at least one programmable circuit to at least one of instantiate or execute machine readable instructions to: analyze temperature data indicative of a first temperature of a first compute device and a second temperature of a second compute device; and cause an adjustment in at least one of a first workload executed by the first compute device or a second workload executed by the second compute device based on the temperature data, the adjustment to reduce a difference between the first and second temperatures.

What is claimed is: 
     
         1 . A first compute device comprising:
 interface circuitry;   machine readable instructions; and   at least one programmable circuit to at least one of instantiate or execute the machine readable instructions to:
 analyze temperature data indicative of a first temperature of the first compute device and a second temperature of a second compute device; and 
 cause an adjustment in at least one of (a) a first workload executed by the first compute device or a second workload executed by the second compute device based on the analysis of both the first temperature and the second temperature or (b) a second workload executed by the second compute device based on the analysis of both the first temperature and the second temperature, the adjustment to reduce a difference between the first and second temperatures. 
   
     
     
         2 . The first compute device of  claim 1 , wherein the first compute device is a first server in a server cluster and the second compute device is a second server in a server cluster. 
     
     
         3 . The first compute device of  claim 1 , wherein the first compute device is a first operating component of a server and the second compute device is a second operating component of the server. 
     
     
         4 . The first compute device of  claim 1 , wherein one or more of the at least one programmable circuit is to determine first and second weighted values for the respective first and second compute devices based on the temperature data, the adjustment based on the first and second weighted values. 
     
     
         5 . The first compute device of  claim 4 , wherein one or more of the at least one programmable circuit is to generate a thermal weight matrix that includes the first and second weighted values, the thermal weight matrix including rows and columns according to a physical arrangement of a plurality of interconnected compute devices, the plurality of interconnected compute devices includes the first and second compute devices. 
     
     
         6 . The first compute device of  claim 4 , wherein one or more of the at least one programmable circuit is to execute a neural network to generate the weighted values. 
     
     
         7 . The first compute device of  claim 1 , wherein the first temperature is based on a first measurement by a first temperature sensor associated with the first compute device and the second temperature is based on a second measurement by a second temperature sensor associated with the second compute device. 
     
     
         8 . The first compute device of  claim 1 , wherein the temperature data is based on a thermographic image of the first and second compute devices captured by a thermal camera. 
     
     
         9 . The first compute device of  claim 1 , wherein one or more of the at least one programmable circuit is to determine a first workload adjustment value for the first compute device, the first workload adjustment value based on a difference between the first temperature and the second temperature. 
     
     
         10 . The first compute device of  claim 9 , wherein the first workload adjustment value is to indicate an excess workload of the first compute device when the first temperature is higher than an average temperature of one or more other compute devices in direct communication with the first compute device, the one or more other compute devices including the second compute device. 
     
     
         11 . The first compute device of  claim 10 , wherein one or more of the at least one programmable circuit is to:
 generate a task offloading request based on the excess workload, the task offloading request to designate a task to be offloaded to the second compute device;   cause transmission of the task offloading request to the second compute device;   transfer the task to the second compute device when the second compute device accepts the task offloading request; and   retain the task at the first compute device when the second compute device rejects the task offloading request.   
     
     
         12 . The first compute device of  claim 11 , wherein a workload amount designated in the task offloading request corresponds to the excess workload divided by a number of the one or more other compute devices. 
     
     
         13 . The first compute device of  claim 9 , wherein the first workload adjustment value is to indicate an excess capacity of the first compute device when the first temperature is lower than an average temperature of one or more other compute device in direct communication with the first compute device, the one or more other compute devices including the second compute device. 
     
     
         14 . The first compute device of  claim 13 , wherein one or more of the at least one programmable circuit is to:
 accept a task offloading request from the second compute device when a workload amount designated in the task offloading request is less than the excess capacity; and   reject the task offloading request when the workload amount is greater than the excess capacity.   
     
     
         15 . The first compute device of  claim 13 , wherein at least one of the one or more other compute devices is in direct communication with an additional compute device, the first compute device not in direct communication with the additional compute device. 
     
     
         16 . A non-transitory machine readable storage medium comprising instructions to cause a first compute device to at least:
 analyze temperature data indicative of a first temperature of the first compute device and a second temperature of a second compute device; and   cause an adjustment in at least one of (a) a first workload executed by the first compute device based on the analysis of both the first temperature and the second temperature or (b) a second workload executed by the second compute device based on the analysis of both the first temperature and the second temperature, the adjustment to reduce a difference between the first and second temperatures.   
     
     
         17 . The non-transitory machine readable storage medium of  claim 16 , wherein the instructions cause the first compute device to determine a first workload adjustment value for the first compute device, the first workload adjustment value based on a difference between the first temperature and the second temperature. 
     
     
         18 . A server cluster comprising:
 a first server;   a first temperature sensor to measure a first temperature of the first server;   a second server; and   a second temperature sensor to measure a second temperature of the second server, the second server to provide the second temperature to the first server, the first server to cause a change to a workload of the first server based on both the first temperature and the second temperature.   
     
     
         19 . The server cluster of  claim 18 , wherein the change to the workload is a first change to a first workload, the first server is to provide the first temperature to the second server, and the second server is to cause a second change to a second workload of the second server based on the first and second temperatures. 
     
     
         20 . The server cluster of  claim 19 , wherein the first change in the first workload includes transferring a task from the first server to the second server in response to a determination by the first server that the first temperature is higher than the second temperature, and the second change in the second workload includes accepting the task from the first server in response to a determination by the second server that the first temperature is higher than the second temperature.