US2026009768A1PendingUtilityA1
Systems, methods, and apparatus for inspection using phased array sensor
Est. expiryDec 23, 2042(~16.4 yrs left)· nominal 20-yr term from priority
Inventors:DAVID CHASEBINGER MICHAEL ALOW KEVIN YDESOTO RYANREITZ BRANDON JBOWMAN SPENCERBRYNER EDWARD ABIGLAN ALBERT J
G01N 2291/106G01N 29/2487G01N 29/225G01N 29/265G01N 29/262G01N 29/041G01N 29/043G01N 29/28G01N 2291/0258G01N 29/26G01N 29/227G01N 29/226B25J 19/026
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Claims
Abstract
A method may collect inspection surface data at a first location proximate to an inspection surface of an asset. The method may transmit the inspection surface data to a second location distinct from the first location. The method may receive an inspection control parameter from the second location. The method may perform an inspection operation with an inspection robot having a phased array sensor, in response to the inspection control parameter, where the inspection control parameter comprises an inspection trajectory value.
Claims
exact text as granted — not AI-modified1 . A method, comprising:
collecting inspection surface data at a first location proximate to an inspection surface of an asset; transmitting the inspection surface data to a second location distinct from the first location; receiving an inspection control parameter from the second location; and performing an inspection operation with an inspection robot having a phased array sensor, in response to the inspection control parameter, wherein the inspection control parameter comprises an inspection trajectory value.
2 . The method of claim 1 , wherein the inspection surface data comprises an inspection surface description, and the inspection surface data comprises inspection data collected by the inspection robot operating on the inspection surface.
3 . The method of claim 2 , further comprising analyzing the inspection data, and determining the inspection control parameter in response to the analyzing.
4 . The method of claim 1 , wherein the inspection control parameter further comprises an inspection robot configuration parameter.
5 . The method of claim 4 , wherein performing the inspection operation further comprises performing at least one of:
configuring a payload of the inspection robot in response to the inspection robot configuration parameter; configuring a circuit layout of the inspection robot in response to the inspection robot configuration parameter; configuring an interface of the inspection robot in response to the inspection robot configuration parameter; configuring a drive module of the inspection robot in response to the inspection robot configuration parameter; or performing any one or more of the foregoing for a plurality of inspection robots, the plurality of inspection robots including the inspection robot.
6 . The method of claim 1 , wherein the inspection control parameter comprises a sensor selection value.
7 . The method of claim 6 , wherein performing the inspection operation comprises performing an inspection of the inspection surface with the inspection robot.
8 . The method of claim 1 , wherein performing the inspection operation comprises at least one operation selected from:
moving the inspection robot on the inspection surface in response to the inspection trajectory value; activating sensors of the inspection robot in response to the inspection trajectory value; placing the inspection robot on the inspection surface in response to the inspection trajectory value; or performing any one or more of the foregoing for a plurality of inspection robots including the inspection robot.
9 . A system, comprising:
a controller, comprising: an inspection surface description circuit structured to interpret inspection surface data; a remote inspection evaluation circuit structured to transmit the inspection surface data to an external device, and to receive an inspection control parameter from the external device; and an inspection execution circuit structured to perform an inspection operation configured in response to the inspection control parameter, wherein the inspection control parameter comprises an inspection trajectory value.
10 . The system of claim 9 , further comprising:
an inspection robot having a phased array sensor and a robot controller configured to control motive operations of the inspection robot on the inspection surface in response to the inspection trajectory value.
11 . The system of claim 9 , wherein the inspection execution circuit is further structured to perform the inspection operation by transmitting the inspection trajectory value to a robot controller positioned on the inspection robot.
12 . The system of claim 9 , wherein the inspection surface data comprises inspection data received from an inspection robot having a phased array sensor operating on the inspection surface.
13 . The system of claim 9 , wherein the inspection control parameter further comprises at least one of an inspection robot configuration parameter or a sensor selection value.
14 . The system of claim 13 , further comprising:
the inspection control parameter further comprising the inspection robot configuration parameter; and an inspection robot having a phased array sensor and a robot controller configured to configure an aspect of the inspection robot in response to the inspection robot configuration parameter.
15 . A system, comprising:
a controller, comprising: an inspection surface description circuit structured to interpret inspection surface data; a remote inspection evaluation circuit structured to transmit the inspection surface data to an external device, and to receive an inspection control parameter from the external device; an inspection execution circuit structured to perform an inspection operation configured in response to the inspection control parameter, wherein the inspection control parameter comprises an inspection execution parameter; and an inspection robot having a phased array sensor and a robot controller configured to operate the inspection robot on the inspection surface in response to the inspection execution parameter.
16 . The system of claim 15 , wherein the inspection surface data comprises inspection data received from the inspection robot having the phased array sensor operating on the inspection surface.
17 . The system of claim 15 , wherein the inspection control parameter further comprises at least one of an inspection trajectory value, an inspection robot configuration parameter, or a sensor selection value.
18 . The system of claim 15 , wherein the inspection execution parameter defines at least one of a couplant flow rate, an inspection robot velocity, an operating limit, a down force to be applied for a payload of the inspection robot, a time limit, or a power setting.
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