Cold-rolled steel plate for hot forming, having excellent corrosion-resistance and spot-weldability, hot-formed member, and method for manufacturing same

Abstract

An aspect of the present invention relates to a cold-rolled steel plate for hot forming, which is excellent in corrosion-resistance and spot-weldability, contains, by weight %, C: 0.1-0.4%, Si: 0.5-2.0%, Mn: 0.01-4.0%, Al: 0.001-0.4%, P: 0.001-0.05%, S: 0.0001-0.02%, Cr: 0.5% to less than 3.0%, N: 0.001-0.02%, and a balance of Fe and inevitable impurities, satisfying formula (1) below, and includes an Si amorphous oxidation layer continuously or discontinuously formed at a thickness of 1 nm-100 nm on the surface thereof. Formula (1): 1.4≤0.4*Cr+Si≤3.2 (wherein element symbols denote measurements of respective element contents by weight %).

1 . A hot-formed product, comprising:
 a base steel;   a first oxide layer comprising Si on the base steel; and   a second oxide layer comprising Cr and Mn on the base steel;   wherein the first oxide layer and the second oxide layer are continuously or discontinuously formed on the base steel,   wherein a first thickness of the first oxide layer is smaller than a second thickness of the first oxide layer, and   wherein a first thickness of the second oxide layer is smaller than a second thickness of the second oxide layer.   
     
     
         2 . The hot-formed member of  claim 1 ,
 wherein the first oxide layer comprises Fe.   
     
     
         3 . The hot-formed member of  claim 1 ,
 wherein the first oxide layer comprises Mn.   
     
     
         4 . The hot-formed member of  claim 1 ,
 wherein the first oxide layer comprises Cr.   
     
     
         5 . The hot-formed member of  claim 1 ,
 wherein an amount of Si of the first oxide layer is greater than an amount of Mn of the first oxide layer.   
     
     
         6 . The hot-formed member of  claim 1 ,
 wherein the amount of Si of the first oxide layer is greater than an amount of Cr of the first oxide layer.   
     
     
         7 . The hot-formed member of  claim 1 ,
 wherein the second thickness of the first oxide layer is 2000 nm or less.   
     
     
         8 . The hot-formed member of  claim 1 ,
 wherein the second thickness of the first oxide layer is 1000 nm or less.   
     
     
         9 . The hot-formed member of  claim 1 ,
 wherein the first oxide layer is analyzed by a Transmission Electron Microscope (TEM).   
     
     
         10 . The hot-formed member of  claim 1 ,
 wherein the first oxide layer is analyzed by an EPMA.   
     
     
         11 . A hot-formed product, comprising:
 a base steel; and   a first oxide layer comprising Si on the base steel;   wherein the first oxide layer is continuously or discontinuously formed on the base steel, and   wherein a first thickness of the first oxide layer is smaller than a second thickness of the first oxide layer.   
     
     
         12 . The hot-formed member of  claim 11 ,
 wherein the first oxide layer comprises Fe.   
     
     
         13 . The hot-formed member of  claim 11 ,
 wherein the first oxide layer comprises Mn.   
     
     
         14 . The hot-formed member of  claim 11 ,
 wherein the first oxide layer comprises Cr.   
     
     
         15 . The hot-formed member of  claim 11 ,
 wherein an amount of Si of the first oxide layer is greater than an amount of Mn of the first oxide layer.   
     
     
         16 . The hot-formed member of  claim 11 ,
 wherein the amount of Si of the first oxide layer is greater than an amount of Cr of the first oxide layer.   
     
     
         17 . The hot-formed member of  claim 11 ,
 wherein the second thickness of the first oxide layer is 2000 nm or less.   
     
     
         18 . The hot-formed member of  claim 11 ,
 wherein the second thickness of the first oxide layer is 1000 nm or less.   
     
     
         19 . The hot-formed member of  claim 11 ,
 wherein the first oxide layer is analyzed by a Transmission Electron Microscope (TEM).   
     
     
         20 . The hot-formed member of  claim 11 ,
 wherein the first oxide layer is analyzed by an EPMA.