US2026048470A1PendingUtilityA1
Substrate polishing apparatus
Assignee: SAMSUNG ELECTRONICS CO LTDPriority: Aug 13, 2024Filed: Mar 25, 2025Published: Feb 19, 2026
Est. expiryAug 13, 2044(~18 yrs left)· nominal 20-yr term from priority
H10P 52/00B24B 37/32B24B 37/24B24B 37/046B24B 37/20
51
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Claims
Abstract
A substrate polishing apparatus may be provided. The substrate polishing apparatus may include a platen, a polishing pad on the platen, a polishing head on the polishing pad, the polishing head including a polishing head body and a first magnetic structure on a side surface of the polishing head body, and a second magnetic structure adjacent to the first magnetic structure, wherein the second magnetic structure overlaps at least a portion of the first magnetic structure in a plan view.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A substrate polishing apparatus comprising:
a platen; a polishing pad on the platen; a polishing head on the polishing pad, the polishing head comprising a polishing head body and a first magnetic structure on a side surface of the polishing head body; and a second magnetic structure adjacent to the first magnetic structure, wherein the second magnetic structure overlaps at least a portion of the first magnetic structure in a plan view.
2 . The substrate polishing apparatus of claim 1 , wherein the second magnetic structure is in the platen.
3 . The substrate polishing apparatus of claim 2 , wherein the second magnetic structure includes an inner magnet and an outer magnet on an outer side of the inner magnet, and
wherein at least a portion of the polishing head is positioned between the inner magnet and the outer magnet in a plan view.
4 . The substrate polishing apparatus of claim 3 , wherein each of the inner magnet and the outer magnet has a ring shape around a rotation axis of the platen in a plan view.
5 . The substrate polishing apparatus of claim 3 , wherein the inner magnet comprises a plurality of spaced apart inner magnets and the outer magnet comprises a plurality of spaced apart outer magnets.
6 . The substrate polishing apparatus of claim 2 , wherein the second magnetic structure includes a plurality of straight magnets, and
wherein the plurality of straight magnets is arranged radially about a rotation axis of the platen in a plan view.
7 . The substrate polishing apparatus of claim 2 , wherein the second magnetic structure includes:
an inner magnet having a ring shape; an outer magnet on an outer side of the inner magnet; and a plurality of straight magnets between the inner magnet and the outer magnet.
8 . The substrate polishing apparatus of claim 7 , wherein the inner magnet, the outer magnet, and the plurality of straight magnets are spaced apart from each other.
9 . The substrate polishing apparatus of claim 1 , further comprising a spindle structure on the polishing head,
wherein the second magnetic structure is connected to both ends of the spindle structure.
10 . The substrate polishing apparatus of claim 1 , wherein the first magnetic structure extends from a side surface of the polishing head body to an upper surface of the polishing head body.
11 . A substrate polishing apparatus comprising:
a platen configured to rotate a polishing pad; a polishing head on the polishing pad, the polishing head comprising a first magnetic structure; a second magnetic structure in the platen; and a power supply device electrically connected to the second magnetic structure, wherein the first magnetic structure and the second magnetic structure are configured to form a magnetic force between the first magnetic structure and the second magnetic structure.
12 . The substrate polishing apparatus of claim 11 , wherein the first magnetic structure includes a permanent magnet, and
wherein the second magnetic structure includes an electromagnet.
13 . The substrate polishing apparatus of claim 11 , wherein the second magnetic structure vertically overlaps at least a portion of the first magnetic structure.
14 . The substrate polishing apparatus of claim 11 , wherein the polishing head includes a polishing head body and a retainer ring on a lower surface of the polishing head body, and
wherein the first magnetic structure surrounds a side surface of the polishing head body.
15 . The substrate polishing apparatus of claim 11 , wherein the second magnetic structure includes a plurality of straight magnets arranged radially about a rotation axis of the platen, and
wherein the plurality of straight magnets is configured to be sequentially turned on/off.
16 . A substrate polishing apparatus comprising:
a platen configured to support and rotate a polishing pad; a polishing head on the polishing pad, the polishing head comprising a polishing head body and a first magnetic structure surrounding a side surface of the polishing head body; a second magnetic structure in the platen; a slurry supply device supplying slurry onto the polishing pad; a conditioning device spaced apart from the polishing head on the platen; and a power supply device electrically connected to the second magnetic structure, wherein the second magnetic structure overlaps at least a portion of the first magnetic structure.
17 . The substrate polishing apparatus of claim 16 , wherein the second magnetic structure includes an inner magnet and an outer magnet spaced apart from each other, and wherein each of the inner magnet and the outer magnet has a ring shape in a plan view.
18 . The substrate polishing apparatus of claim 17 , wherein the first magnetic structure extends from a side surface of the polishing head body to an upper surface of the polishing head body, and
wherein the inner magnet comprises a plurality of inner magnets and the outer magnet comprises a plurality of outer magnets.
19 . The substrate polishing apparatus of claim 16 , wherein the second magnetic structure includes a plurality of straight magnets arranged radially about a rotation axis of the platen, and
wherein some of the straight magnets overlap the first magnetic structure.
20 . The substrate polishing apparatus of claim 16 , wherein a magnetic force is configured to be formed between the first magnetic structure and the second magnetic structure.Join the waitlist — get patent alerts
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