US4428224AExpiredUtility

Apparatus and method for testing of a rotary movement-electrical signal transducer system

64
Assignee: SUN ELECTRIC CORPPriority: Mar 23, 1979Filed: Jul 14, 1980Granted: Jan 31, 1984
Est. expiryMar 23, 1999(expired)· nominal 20-yr term from priority
B60T 8/885G01P 3/489B60T 2270/416G01R 31/00B60T 2270/406G01P 11/00G01R 23/15
64
PatentIndex Score
13
Cited by
3
References
5
Claims

Abstract

An apparatus and method for dynamic testing of a rotary movement-electrical signal transducer system, such as found in an automotive anti-blocking system.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A method for testing a rotary movement-electrical signal transducer system of the type generating a series of signals during operation thereof, comprising the steps of: receiving said signals;   measuring the time of each of said signals to establish the periods therefor;   comparing said periods to determine a maximum period and a minimum period thereof;   determining an average period for said periods;   comparing said average period to said minimum period and said maximum period to provide a first evaluation interval and a second evaluation interval, respectively;   generating a reference interval;   comparing said reference interval to said first evaluation interval and said second evaluation interval; and   generating a postive test signal whenever said first evaluation interval and said second evaluation interval are less than said reference interval.   
     
     
       2. An apparatus for testing a rotary movement-electrical signal transducer system, said system providing a series of pulses during operation thereof, comprising: input means coupled to said system for receiving said pulses;   means for measuring the time of each of said pulses to establish a series of periods relted to said pulses;   processor means for receiving said series of periods and for determining therefrom a miximum, minimum and average of said periods, said processor means calculating a first evaluation interval from said minimum and said average and a second evaluation interval from said maximum and said average;   said processor means further generating a reference interval and comparing said first evaluation interval and said second evaluation interval thereto, said processor means transmitting a positive test signal whenever said first evaluation interval and said second evaluation interval are less than said reference interval; and output means for displaying said positive test signal.   
     
     
       3. An apparatus as claimed in claim 2 wherein said input means includes a wave shaping circuit to produce a square wave in response to said pulses. 
     
     
       4. An apparatus as claimed in claim 2 wherein said means for measuring includes a controller, a clock and a counter, said controller being coupled and responsive to said input means, said clock and said counter being coupled and responsive to said controller. 
     
     
       5. An apparatus as claimed in claim 4 wherein said processor means is coupled to said controller and said counter.

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