US4845766AExpiredUtility

Simultaneous projection feature analysis apparatus

35
Assignee: NIPPON SHEET GLASS CO LTDPriority: May 11, 1987Filed: May 11, 1987Granted: Jul 4, 1989
Est. expiryMay 11, 2007(expired)· nominal 20-yr term from priority
G06V 10/88
35
PatentIndex Score
10
Cited by
11
References
14
Claims

Abstract

In an apparatus for serially performing simultaneous feature processing and similarity discrimination of an image such as a character or any other figure, an input image is multiplied by a first multiplier into a plurality of optical pattern images which are respectively supplied to means for detecting different types of projection features. The means for detecting different types of projection features simultaneously performs different types of projection operations of the input image. The optical pattern image obtained by converting a vector corresponding to the different types of projection features is displayed on a vector display. The optical pattern image displayed on the display is multiplied by a second multiplier into optical images which are then respectively supplied to different types of reference masks. Optical pattern matching between the optical images from the second multiplier and the different types of reference patterns is simultaneously performed.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A simultaneous projection feature analysis apparatus comprising: first multiplying means for optically multiplying an input image to form a plurality of optical pattern images of a substantially identical shape, said first multiplying means comprising a first projection lens and first lens array;   different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions from the plurality of optical pattern images;   a vector display for causing the different types of one-dimensional projection intensity distributions to correspond to a vector and displaying predetermined optical pattern images at positions corresponding to magnitudes of vector components of the vector;   different types of reference masks having reference patterns to be matched with the predetermined optical pattern images;   second multiplying means for multiplying the predetermined optical pattern image displayed on the vector display to form a plurality of optical pattern images of a substantially identical shape near said different types of reference masks, said second multiplying means comprising a second projection lens and second lens array; and   photodetecting means for detecting lights derived from matching between the optical pattern images formed by said second multiplying means and the reference patterns through said different types of reference masks.   
     
     
       2. An apparatus according to claim 1, further comprising: an image sensor for detecting the input image;   preprocessing means for preprocessing the image signal from said image sensor so as to shape the image; and   a first display for displaying as an optical input image the image signal preprocessed by said preprocessing means,   the input image displayed on said display being optically multiplied by said first multiplying means.   
     
     
       3. An apparatus according to claim 1 wherein each of said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions comprises a light-receiving surface as a combination of a plurality of photosensor elements, the combinations of said plurality of photosensor elements in said light-receiving surfaces being different from each other in said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions, and   the plurality of optical pattern images formed by said first mulitplying means are respectively formed on said light-receiving surfaces of said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions.   
     
     
       4. An apparatus according to claim 1, wherein at least one of said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions comprises a plurality of strip-like photosensor elements, said strip-like photosensor elements being arranged adjacent to each other along one direction. 
     
     
       5. An apparatus according to claim 4, wherein said one direction is inclined with respect to the optical pattern images subjected to projection feature detection. 
     
     
       6. An apparatus according to claim 1, wherein at least one of said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions comprises a plurality of square photosensor elements having substantially an identical size, said square photosensor elements being arranged to be adjacent to each other in a matrix form. 
     
     
       7. An apparatus according to claim 4, wherein the plurality of photosensors are arranged to partially correspond to the optical pattern images subjected to one-dimensional projection intensity distribution in a plurality of directions detection. 
     
     
       8. An apparatus according to claim 1, wherein at least one of said different type of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions comprises a plurality of annular photosensor elements having different diameters which are sequentially changed, said annular photosensor elements being sequentially arranged in a radial direction. 
     
     
       9. An apparatus according to claim 1, wherein at least one of said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions comprises a plurality of sector-shaped phototsensor elements which are sequentially arranged such that vertices thereof are concentrated substantially at one point so as to constitute a circle. 
     
     
       10. An apparatus according to claim 1 wherein each of said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions comprises combinations of different types of masks having projection slits formed at different positions and single element sensors arranged in correspondence with said different types of masks, said projection slits having different patterns in said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions, and the plurality of optical pattern images multiplied by said first multiplying means being respectively projected on said single element sensors through said projections slits. 
     
     
       11. An apparatus according to claim 1, further comprising display control means for receiving projection data from said different types of means for detecting different types of one-dimensional projection intensity distributions in a plurality of directions and for controlling to display the predetermined optical pattern images at positions corresponding to the magnitudes of the projection data on a screen of said vector display. 
     
     
       12. An apparatus according to claim 1, wherein the reference patterns formed on said reference mask have a predetermined shape which is not changed to another shape. 
     
     
       13. An apparatus according to claim 1, wherein the reference pattern formed on said reference mask comprises a spatial modulation element, and the reference patterns respectively constituted by said spatial modulation elements are changed according to reference data transferred from a data base. 
     
     
       14. An apparatus according to claim 1, wherein the reference pattern formed on said reference mask is constituted by a gray scale.

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