Chip carrier socket test probe

Abstract

A test probe for use with a chip carrier socket including electrical connections to an external testing device and contacts to engage matching contacts within the chip socket. Tong-like elements grasp the socket to insure both mechanical and electrical integrity of the connections. A slip ring retains the tongs and probe in operated position.

What is claimed is: 
     
       1. A test probe for use with a chip carrier socket comprising: a body portion, including a plurality of sides and first and second ends;   said first end configured for insertion into and mating with said chip carrier socket;   a plurality of electrical contacts located on said first end of said probe body portion;   a plurality of electrical conductors each attached to at least one of said electrical contacts internally of said body portion and adapted to be connected to an associated electrical testing device;   a plurality of socket engagement means each attached to said body for grasping said socket;   a square shaped slip-ring device encircling said plurality of socket engagement-means, to apply equal pressure to all of said engagement means simultaneously when manually moved towards said probe first end;   and indexing means comprising the cross-sectional geometry of said test probe body adapted to be aligned to correspond to indexing means included in said chip carrier socket;   whereby in response to insertion into said socket, said probe body indexing means and corresponding indexing means included in said carrier socket ensure proper orientation of said probe in said socket, and in response to said engagement means grasping said socket, both electrical and mechanical connection is established between said probe and said chip carrier socket.   
     
     
       2. A test probe as claimed in claim 1 wherein: said electrical conductors exit said probe at said second end.   
     
     
       3. A test probe as claimed in claim 1 wherein: at least one of said socket engagement means is attached to each of said sides.   
     
     
       4. A test probe as claimed in claim 1 wherein: at least one of said socket engagement means is attached to said probe at each junction of two of said sides.   
     
     
       5. A test probe as claimed in claim 1 wherein: said socket engagement means are attached to said probe adjacent to said second end.   
     
     
       6. A test probe as claimed in claim 1 wherein: said socket engagement means each extend beyond said first end.   
     
     
       7. A test probe as claimed in claim 1 wherein: said socket engagement means are of resilient construction.   
     
     
       8. A test probe as claimed in claim 1 wherein: said body portion is constructed of electrical insulating material.