Method and apparatus for improving RF contact positioning in an RF test socket

Abstract

A method and apparatus for improving RF contact positioning in a RF test socket is disclosed. The RF test socket comprises a housing having a plurality of notches along one side for clamping to a RF test board and postioning a plurality of contacts in the notches between the housing and the RF test board. The plurality of notches are formed in a step fashion wherein when the housing is clamped to the RF test board, the housing deflects such that the plurality of contacts contact the RF test board with equal force. The plurality of notches are lower in a center of the housing and higher along the edges thereby defining a catenary shape of notches along the housing and are further machined to a specific height for applying equal force or the plurality of contacts.

What is claimed is:  
     
       1. An RF test apparatus for improving RF contact positioning, comprising: 
       a housing having a plurality of notches formed in a step fashion along one side of the housing, wherein the plurality of notches are formed in the housing to be lower in a center of the housing and higher in a direction away from the center of the housing;  
       a plurality of contacts, each contact being fitted into one of the notches; and  
       an RF test board, wherein when said housing is clamped onto said RF test board, the housing deflects such that the plurality of contacts in the notches all contact the RF test board.  
     
     
       2. The RF test apparatus of claim  1  wherein 
       the housing is made of plastic.  
     
     
       3. The RF test apparatus according to claim  1 , wherein the plurality of notches are formed in the housing in a step fashion to define a catenary shape along the housing. 
     
     
       4. The RF test apparatus according to claim  3 , wherein each of the plurality of notches is machined to a specific height for applying an equal force on the contacts when the housing and the RF test board are clamped together. 
     
     
       5. The RF test apparatus according to claim  4 , wherein the specific heights are machined to change the catenary shape to increase the force applied to the plurality of contacts when the housing and the RF test board are clamped together. 
     
     
       6. The RF test apparatus according to claim  4 , wherein the specific heights are machined to change the catenary shape to decrease the force applied to said plurality of contacts when said housing and RF test board are clamped together. 
     
     
       7. The RF test apparatus according to claim  1 , further comprising: 
       a plurality of holding screws in the housing for clamping the housing to the RF test board with equal force.  
     
     
       8. The RF test apparatus according to claim  1 , further comprising 
       gold plating on the plurality of contacts.  
     
     
       9. A method for improving RF contact positioning, the steps of the method comprising: 
       forming a plurality of notches in a step fashion along one side of a housing, wherein the plurality of notches are formed in the housing to be lower in a center of the housing and higher in a direction away from the center of the housing;  
       postioning a plurality of contacts into the notches in the housing; and  
       clamping the housing to the RF test boards wherein the housing deflects such that the plurality of contacts in the notches contact the RF test board.  
     
     
       10. The method according to claim  9 , wherein the housing is made out of plastic. 
     
     
       11. The method according to claim  10 , wherein the forming a plurality of notches steps further comprises: 
       defining the plurality of notches to be lower in a center of the housing.  
     
     
       12. The method according to claim  9 , wherein the forming a plurality of notches step further comprises: 
       defining a catenary shape for the plurality of notches along the housing.  
     
     
       13. The method of claim  12 , wherein the forming a plurality of notches step further comprises: 
       machining each one of the plurality of notches to a specific height for applying an equal force on the plurality of the contacts when the housing and the RF test board are clamped together.  
     
     
       14. The method according to claim  13 , wherein the forming a plurality of notches step further comprises: 
       machining the specific heights to change the catenary shape to increase a force applied to the plurality of contacts when the housing and the RF test board are clamped together.  
     
     
       15. The method according to claim  13 , wherein the forming a plurality of notches step further comprises: 
       machining the specific heights to change the catenary shape to decrease a force applied to said plurality of contacts when said housing and said RF test board are clamped together.  
     
     
       16. The method according to claim  9 , further comprising: 
       clamping the housing with a plurality of holding screws to the RF test board with equal force.  
     
     
       17. The method according to claim  9 , further comprising 
       gold-plating the plurality of contacts.  
     
     
       18. An RF test apparatus for improving RF contact positioning, comprising: 
       a plastic housing having a plurality of notches formed in a step fashion along one side, wherein the plurality of notches are formed in the housing to be lower in a center of the housing and higher in a direction away from the center of the housing;  
       a plurality of contacts, each contact being fitted into one of the notches; and  
       an RF test board.  
     
     
       19. The RF test apparatus according to claim  18  wherein each of the notches is machined to a specific height for applying an equal force on the contacts when the housing and the RF test board are clamped together.