US6232908B1ExpiredUtility
A/D converter having a dynamic encoder
Est. expirySep 29, 2017(expired)· nominal 20-yr term from priority
Inventors:Sachio Nakaigawa
H03M 1/365H03M 1/0863
93
PatentIndex Score
160
Cited by
10
References
17
Claims
Abstract
An A/D converter includes a resistor ladder for generating a plurality of reference potentials, a comparing section for comparing each of the reference potentials against an input analog signal to output a thermometric code, and a dynamic encoder composed of a combinational circuit to encode the thermometric code to a binary code by responding a clock signal. The A/D conversion is finished in a single clock cycle at a high speed, with a reduced number of elements and reduced power dissipation.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. An analog-to-digital (A/D) converter comprising:
a reference voltage generator for generating a plurality of reference voltages;
a comparing section including a plurality of comparing elements each comparing an input analog signal against a corresponding one of said reference voltages to output a thermometric code; and
a dynamic encoder including a plurality of bit lines and a dynamic combinational circuit transferring said thermometric code to said bit lines by responding to a clock,
wherein said input analog signal is converted in a single clock cycle to a binary code generated on said bit lines and corresponding to a magnitude of said input analog signal;
wherein a rate of conversion is substantially independent of a number of bits to be output,
wherein each comparing element of said comparing section comprises a comparator and a level converter for amplifying an output from said comparator by responding to a clock signal, and,
wherein said level converter comprises CMOS transistors.
2. An A/D converter as defined in claim 1 , wherein said combinational circuit comprises a complementary signal generator activated by a clock signal.
3. An A/D converter as defined in claim 1 , wherein said level converter outputs a complementary signal.
4. An A/D converter as defined in claim 1 , wherein said dynamic encoder comprises a non-dichotomizing search encoder.
5. An A/D converter as defined in claim 1 , wherein said A/D converter contains an error correcting function.
6. An A/D converter as defined in claim 1 , wherein said A/D converter is devoid of latches.
7. An A/D converter as defined in claim 1 , wherein said thermometric code is converted to said binary code at a rate which is not dependent upon the number of bits to be output.
8. An A/D converter as defined in claim 1 , wherein the value of each bit of the output binary code does not depend on values of other bits.
9. An A/D converter as defined in claim 1 , wherein said dynamic encoder further comprises one of p-channel transistors and n-channel transistors.
10. An A/D converter as defined in claim 1 , wherein said reference voltage generator comprises a resistor ladder having a plurality of nodes adjacent two resistors and connected between a high voltage source and a low voltage source.
11. An A/D converter as defined in claim 1 , wherein said dynamic encoder further comprises an encoding section having n-channel transistors which connect said bit lines to a ground, a precharge section having p-channel transistors, and inverters at output ends of said bit lines.
12. An A/D converter as defined in claim 11 , wherein said dynamic encoder further comprises an array of complementary signal generators which have a dynamic configuration and receive outputs from said level converter.
13. An A/D converter as defined in claim 12 , wherein each said complementary signal generator comprises an inverter and two AND gates.
14. An analog-to-digital (A/D) converter comprising:
a reference voltage generator for generating a plurality of reference voltages;
a comparing section including a plurality of comparing elements each comparing an input analog signal against a corresponding one of said reference voltages to output a thermometric code; and
a dynamic encoder including a plurality of bit lines and a dynamic combinational circuit transferring said thermometric code to said bit lines by responding to a clock,
wherein said thermometric code is converted in a single clock cycle to a binary code generated on said bit lines and corresponding to a magnitude of said input analog signal, and
wherein said conversion is expressed by the Boolean algebra equation: b m = ∑ i = 1 2 ( m - 1 ) ( C ( t x ) × t y )
wherein N is a number of bits of said binary code, b m is a m-th bit of said binary code counted from most significant bit (MSB), t x is the x-th bit of said thermometric code counted from MSB, t y is the y-th bit of said thermometric code counted from MSB, C(t x ) is a complement of t x , 0≦x≦ N −2, 1≦y≦2 N −1, x=2(i−1)×2 (N−m) ,y={2(i−1)+1}×2 (N−m) , and 1≦m≦N.
15. An A/D converter as defined in claim 14 , further comprising a digital adder for receiving a binary code of N bits from said dynamic encoder in synchronicity therewith to output a digital code having Y bits.
16. A method for converting a thermometric code to a binary code, comprising:
transferring a thermometric code to a plurality of bit lines by responding to a clock signal, wherein said conversion is expressed by the Boolean algebra equation: b m = ∑ i = 1 2 ( m - 1 ) ( C ( t x ) × t y )
wherein N is a number of bits of said binary code, b m , is a m-th bit of said binary code counted from most significant bit (MSB), t x is the x-th bit of said thermometric code counted from MSB, t y is the y-th bit of said thermometric code counted from MSB, C(t x ) is a complement of t x , 0≦x≦2 N −2, 1≦y≦2 N −1, x=2(i−1)×2 (N−m) , y={2(i−1)+1}×2 (N−m) , and 1≦m≦N.
17. A method as defined in claim 16 , wherein said conversion is conducted in a single clock cycle.Join the waitlist — get patent alerts
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