Method of fabricating a silicon solar cell
Abstract
A method of fabricating a back surface point contact silicon solar cell having p-doped regions and n-doped regions on the same side by forming a passivating layer on a surface of the cell having opened windows at the p-doped regions and the n-doped regions, b depositing and patterning a first metal layer on the passivating layer in such a way that the first metal layer comes into contact with the p-doped regions and the n-doped regions, by depositing a first insulator layer of polyimide on the first metal layer, by etching and patterning the first insulator layer of polyimide in such a way that the insulator layer has opened windows at, at least one of the p-doped regions and the n-doped regions, by depositing a second insulator layer of polyimide on the first insulator layer of polyimide, by etching and patterning the second insulator layer of polyimide in such a way that the insulator layer has opened windows at, at least one of the p-doped regions and the n-doped regions, by curing the first insulator layer of polyimide by heating at a predetermined second temperature for a predetermined second time, and by depositing a second metal layer on the second insulator layer of polyimide in such a way that the second metal layer comes into contact with the one of the p-doped regions and the n-doped regions. With this, the cell surface to be soldered onto a metallized substrate is well planarized and even to ensure sufficient conductibility, with less voids and less solder fatigue.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. A method of fabricating a silicon solar cell having p-doped regions and n-doped regions on a same side, comprising the steps of:
(a) forming a passivating layer on a surface of the cell having opened windows at the p-doped regions and the n-doped regions;
(b) depositing and patterning a first metal layer on the passivating layer in such a way that the first metal layer comes into contact with the p-doped regions and the n-doped regions;
(c) depositing a first insulator layer of polyimide on the first metal layer;
(d) etching and patterning the first insulator layer of polyimide in such a way that the insulator layer has opened windows at, at least one of the p-doped regions and the n-doped regions;
(e) depositing a second insulator layer of polyimide on the first insulator layer of polyimide;
(f) etching and patterning the second insulator layer of polyimide in such a way that the insulator layer has opened windows at, at least one of the p-doped regions and the n-doped regions;
(g) curing the first and second insulator layers of polyimide by heating at a predetermined temperature for a predetermined time; and
(h) depositing a second metal layer on the second insulator of polyimide in such a way that the second metal layer comes into contact with the one of the p-doped regions and the n-doped regions.
2. A method of fabricating a silicon solar cell having p-doped regions and n-doped regions on a same side, comprising steps of:
(a) forming a passivating layer on a surface of the cell having opened windows at the p-doped regions and the n-doped regions;
(b) depositing and patterning a first metal layer on the passivating layer in such a way that the first metal layer comes into contact with the p-doped regions and the n-doped regions;
(c) depositing a first insulator layer of polyimide on the first metal layer;
(d) etching and patterning the first insulator of polyimide in such a way that the insulator layer has opened windows at, at least one of the p-doped regions and the n-doped regions;
(e) curing the first insulator layer of polyimide by heating at a predetermined first temperature for a predetermined first time;
(f) depositing a second insulator layer of polyimide on the first insulator layer of polyimide;
(g) etching and patterning the second insulator layer of polyimide in such a way that the insulator layer has opened windows at, at least one of the p-doped regions and the n-doped regions;
(h) curing the second insulator layer of polyimide by heating at a predetermined temperature for a predetermined time; and
(i) depositing a second metal layer on the second insulator layer of polyimide in such a way that the second metal layer comes into contact with the one of the p-doped regions and n-doped regions.
3. A method according to claim 1 , wherein the second insulator layer is deposited in step (e) with a viscosity less than that of the first insulator layer deposited in step (c) to form a film thinner than that of the first insulator layer deposited in step (c).
4. A method according to claim 2 , wherein the second insulator layer is deposited in step (f) with a viscosity less than that of the first insulator layer deposited in step (c) to form a film thinner than that of the first insulator layer deposited in step (c).
5. A method according to claim 1 , wherein the second insulator layer is deposited in step (f) at a speed higher than that of the first insulator layer deposited in step (c).
6. A method according to claim 1 , wherein the first insulator layer is deposited in step (c) to form a film having approximately the same thickness as the first metal layer deposited in step (b).
7. A method according claim 1 , wherein the first insulator layer is etched and patterned in step (d) in such a way that the first insulator layer does not encroach on top of the first metal layer.
8. A method according claim 1 , wherein the second insulator layer is etched and patterned in step (f) in such a way that the first insulator layer does encroach on top of the first metal layer.
9. A method according to claim 2 , wherein the second insulator layer is deposited in step (f) at a speed higher than that of the first insulator layer deposited in step (c).
10. A method according to claim 2 , wherein the first insulator layer is deposited in step (c) to form a film having approximately the same thickness as the first metal layer deposited in step (b).
11. A method according claim 2 , wherein the first insulator layer is etched and patterned in step (d) in such a way that the first insulator layer does not encroach on top of the first metal layer.
12. A method according claim 2 , wherein the second insulator layer is etched and patterned in step (g) in such a way that the first insulator layer does encroach on top of the first metal layer.
13. A method according to claim 1 , wherein the second metal layer is deposited in step (h) at a thickness which is smaller than a thickness of the first metal layer deposited in step (b) and a thickness of the first and second insulator layer of polyimide deposited in steps (c) and (e).
14. A method according to claim 2 , wherein the second metal layer is deposited in step (i) at a thickness which is smaller than a thickness of the first metal layer deposited in step (b) and a thickness of the first and second insulator layer of polyimide deposited in steps (c) and (f).
15. A method according to claim 1 , wherein the second layer is made of a metal stack comprising an adhesion layer, a diffusion barrier and a solderable metal.
16. A method according to claim 1 , wherein the second layer is made of a metal stack comprising a light reflective enhancement, an adhesion layer, a diffusion barrier and a solderable metal.
17. A method according to claim 2 , wherein the second layer is made of a metal stack comprising an adhesion layer, a diffusion barrier and a solderable metal.
18. A method according to claim 2 , wherein the second layer is made of a metal stack comprising a light reflective enhancement, an adhesion layer, a diffusion barrier and a solderable metal.Cited by (0)
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