Method for protecting a specific region in a sample applied in preparing an ultra-thin specimen
Abstract
A method for protecting a specific region in the sample applied in preparing an ultra-thin specimen is disclosed. The method includes the steps of (a) forming a first concavity on a first side of the specific region by a focus ion beam (FIB) technique, (b) forming a second concavity on a second side of the specific region opposite to the first side by the focus ion beam technique, (c) filling the first concavity and the second concavity with a first metallic packing and a second metallic packing respectively, and (d) forming a third metallic packing on the specific region and extending to connecting with the first metallic packing and the second metallic packing to define a protecting device for protecting the specific region.
Claims
exact text as granted — not AI-modifiedWhat is claim is:
1. A method for protecting a specific region in a sample applied in preparing an ultra-thin specimen to be observed by a microscope, comprising steps of:
(a) forming a first parallelepiped-like concavity on a first side of said specific region by a focus ion beam (FIB) technique;
(b) forming a second parallelepiped-like concavity on a second side of said specific region opposite to said first side by said focus ion beam technique;
(c) filling said first concavity and said second concavity with a first metallic packing and a second metallic packing respectively; and
(d) forming a third metallic packing over said specific region, said first metallic packing and said second metallic packing directly to define a protecting device for protecting said specific region.
2. The method according to claim 1 wherein said third metallic packing has a first end connecting with said first metallic packing and a second end connecting with said second metallic packing to form said protecting device.
3. The method according to claim 1 wherein said third metallic packing has a first end protruding beyond said first metallic packing and a second end connecting with said second metallic packing to form said protecting device.
4. The method according to claim 1 wherein said third metallic packing has a first end protruding beyond said first metallic packing and a second end protruding beyond said second metallic packing to form said protecting device.
5. The method according to claim 1 wherein said step (c) is executed by a sputtering technique.
6. The method according to claim 1 wherein said microscope is one selected from the group consisting of an optical microscope (OM), a transmission electron microscope (TEM), and a scanning electron microscope (SEM).
7. The method according to claim 1 wherein each of said concavities has a length and width ranging from 1 to 1.5 μm and a depth ranging from 2 to 3 μm.
8. The method according to claim 1 wherein each of said metallic packings is made of one selected from Platinum (Pt) and Tungsten (W).
9. The method according to claim 1 wherein the distance between said first concavity and said second concavity is about 5 μm.
10. The method according to claim 1 wherein said ultra-thin specimen has a thickness of about 0.2 μm.
11. The method according to claim 1 wherein said specific region has a length of about 5 μm and a width of about 0.2 μm.
12. The method according to claim 1 wherein after said step (c), said method further includes a step of forming a third concavity on said first side of said specific region adjacent to said first concavity and then filling said third concavity with a fourth metallic packing.
13. The method according to claim 5 wherein said third metallic packing is extending to connect with said first, said second and said fourth metallic packing to form said protecting device.
14. The method according to claim 1 wherein after said step (d), said method further includes a step of (d1) forming a fourth concavity on a third side of said specific region.
15. The method according to claim 7 wherein after said step (d1), said method further includes a step of (d2) forming a fifth concavity on a fourth side of said specific region opposite to said third side.
16. The method according to claim 1 wherein after said step (d), said method further includes a step of (e) polishing one side of said sample with a higher polishing rate till said protecting device is partially polished.
17. The method according to claim 9 wherein after said step (e), said method further includes a step of (f) polishing said one side of said sample with a lower polishing rate till said protecting device is completely exposed.
18. The method according to claim 10 wherein after said step (f), said method further includes a step of (g) stopping polishing said one side of said sample and then polishing the other side of said sample opposite to said one side.
19. A method for protecting a specific region in a sample applied in preparing an ultra-thin specimen to be observed by a microscope, comprising steps of:
(a) forming a first parallelepiped-like concavity on a first side of said specific region by a focus ion beam (FIB) technique;
(b) forming a second parallelepiped-like concavity on a second side of said specific region opposite to said first side by said focus ion beam technique;
(c) filling said first concavity and said second concavity with a first metallic packing and a second metallic packing respectively; and
(d) forming a third metallic packing on said specific region directly, wherein said third metallic packing has a first end surface connecting with an inner surface of said first metallic packing and a second end surface connecting with an inner surface of said second metallic packing to define a protecting device for protecting said specific region.Cited by (0)
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