P
US6477228B2ExpiredUtilityPatentIndex 74

Method for operating an X-ray diagnosis device with immediate imaging

Assignee: SIEMENS AGPriority: Sep 15, 2000Filed: Sep 14, 2001Granted: Nov 5, 2002
Est. expirySep 15, 2020(expired)· nominal 20-yr term from priority
Inventors:SPAHN MARTIN
H04N 23/63H04N 23/30A61B 6/4233G03B 42/02G01N 23/04A61B 6/00
74
PatentIndex Score
10
Cited by
4
References
7
Claims

Abstract

The invention relates to a method for operating an X-ray diagnosis device for producing X-ray images using an X-ray appliance ( 1 to 5 ), for processing the X-ray images with a computation unit ( 7 ), and for displaying the X-ray images using a reproduction apparatus ( 8 ). According to the invention, the method has the following steps: preprocessing the X-ray images with parameters for full resolution; converting the X-ray images into images with low resolution; processing the images with low resolution with images and/or parameters matched to the reduced resolution; immediately reproducing the images with low resolution; subsequently processing the X-ray images with parameters for full resolution; and reproducing the X-ray images with full resolution.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
       1. A method for operating an X-ray diagnosis device for producing X-ray images using an X-ray appliance, for processing said X-ray images using a computation unit, and for displaying said X-ray images using a reproduction apparatus, comprising the steps of: 
       converting said X-ray images into images with low resolution;  
       processing said images with low resolution with at least one of images and parameters that are matched to said low resolution;  
       immediately reproducing said images with low resolution;  
       subsequently processing said X-ray images with parameters for full resolution; and  
       reproducing said X-ray images with full resolution.  
     
     
       2. The method as claimed in  claim 1 , further comprising the step of preprocessing said X-ray images with parameters for full resolution. 
     
     
       3. The method as claimed in  claim 1 , wherein said step of converting said X-ray images into images with low resolution comprises the step of undersampling said X-ray images. 
     
     
       4. The method as claimed in  claim 1 , wherein one of said parameters is a sampling depth for image preprocessing and image processing. 
     
     
       5. The method as claimed in  claim 1 , wherein one of said parameters for image processing with low resolution is a reduction factor that is an integer. 
     
     
       6. The method as claimed in  claim 1 , further comprising the steps of: 
       performing a first preprocessing for immediate reproduction of said images with low resolution and for reproduction of said images with full resolution; and  
       performing a second preprocessing for reproduction of said images with full resolution after said immediate reproduction of said images with low resolution.  
     
     
       7. The method as claimed in  claim 1 , wherein a number of required images is entered as a parameter for preprocessing and image processing.

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