Fabrication method of optical device having current blocking layer of buried ridge structure
Abstract
An optical device having a current blocking layer of a buried ridge structure and a fabrication method thereof are disclosed. This invention reduces a leakage current between active layer and ion implant layer in buried ridge structure. To minimize leakage current, a P-N-P current blocking layer and an ion implanting current blocking layer are combined. An optical device of the present invention includes: active layers of a mesa structure in a predetermined region on a substrate; a first current blocking layer of a P-N-P structure, which is placed to cover the mesa structure; and a second current blocking layer of a buried ridge structure, which is placed to surround the environs of the first current blocking layer.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. A method for fabricating an optical device, comprising the steps of:
a) forming active layers of a mesa structure in a predetermined region on a substrate;
b) forming a first clad layer having a p-type along the surface of the active layers;
c) forming a second clad layer having a n-type on the first clad layer by using the favorable condition of predominant side growth;
d) exposing the first clad layer in the upper part of the active layers by etching the second clad layer;
e) forming and planarizing a first conductive third clad layer in the upper part of the whole structure completed with the above four steps; and
f) forming a current blocking layer by hydrogen ion implantation on the first clad layer and the second clad layer.
2. The method as recited in claim 1 , wherein the step f) includes the steps of:
f1) forming a blocking mask for ion implantation which covers the active layers and the second clad layer; and
f2) performing hydrogen ion implantation by using the blocking mask for ion implantation.
3. The method as recited in claim 1 , wherein the etching in the step d) is a wet etching.Cited by (0)
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