P
US6882014B2ExpiredUtilityPatentIndex 71

Protection circuit for MOS components

Assignee: TAIWAN SEMICONDUCTOR MFGPriority: Mar 14, 2001Filed: Aug 16, 2001Granted: Apr 19, 2005
Est. expiryMar 14, 2021(expired)· nominal 20-yr term from priority
Inventors:TAN CHIH-PING
H10D 89/811
71
PatentIndex Score
5
Cited by
3
References
1
Claims

Abstract

A protection circuit for MOS components. In the protection circuit, a bypass PMOS transistor has a gate, a source and a substrate, all coupled to a first voltage node and a drain coupled to a gate of a MOS component. A bypass NMOS transistor has a gate, a source and a substrate, all coupled to a second voltage node and a drain coupled to the gate of the MOS component. When positive charges are accumulated on the gate of the MOS component due to an antenna effect, the bypass PMOS transistor dissipates the positive charges to the first voltage node. On the contrary, when negative charges are accumulated on the gate of the MOS component due to antenna effect, the bypass NMOS transistor dissipates the negative charges to the second voltage node.

Claims

exact text as granted — not AI-modified
1. A protection circuit for a MOS component comprising:
 a bypass PMOS transistor, having a gate, a source and a substrate, all coupled to a first voltage node and a drain coupled to a gate of the MOS component;  
 a bypass NMOS transistor, having a gate, a source and a substrate, all coupled to a second voltage node and a drain coupled to the gate of the MOS component;  
 wherein when positive charges are accumulated on the gate of the MOS component due to antenna effect, the bypass PMOS transistor dissipates the positive charges to the first voltage node; and when the negative charges are accumulated on the gate of the MOS component due to antenna effect, the bypass NMOS Transistor dissipates the negative charges to the second voltage node.

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