X-ray laminography inspection system and method

Abstract

For inspecting a structure with non-destructive x-ray laminography inspection, probes are magnetically coupled to opposing surfaces of the structure. The probes include an x-ray source and an x-ray detector which are driven to obtain inspection data that facilitates x-ray laminographic inspection of the structure. A device may be autonomous with a feedback-controlled motor and/or a positional encoder for translation of the probes. A device may include wireless operation. A display may be included to provide real-time visual images of the x-ray laminography or position information.

1. A non-destructive inspection apparatus for inspecting a structure, comprising:
 a first probe configured for being positioned on a first surface of the structure under inspection, the first probe comprising:
 at least one magnetic coupling device; and 
 at least one x-ray source for emitting radiation for inspecting the structure when the first probe is positioned on the first surface of the structure, wherein the x-ray source is configured to provide inspection signals for performing an x-ray laminography inspection technique for inspecting the structure; and 
 
 a second probe configured for being positioned on a second surface of the structure for through transmission inspection, the second probe comprising:
 at least one magnetic coupling device for magnetically coupling the second probe with the first probe, wherein the magnetic attraction of the magnetic coupling holds the first and second probes against the first and second surfaces of the structure; and 
 at least one x-ray detector for receiving the radiation, wherein the x-ray detector is configured to provide x-ray data representing the received radiation for performing the x-ray laminography inspection technique for inspecting the structure. 
 
 
   
   
     2. The apparatus of  claim 1 , wherein the x-ray source and x-ray detector are configured to provide inspection signals and x-ray data, respectively, and wherein the inspection signals and x-ray data are for performing inspection of the structure using the x-ray laminography inspection technique selected from the group consisting of rotational-motion laminography, translational-motion laminography, complex-motion laminography, computed laminography, and multi-point laminography. 
   
   
     3. The apparatus of  claim 1 , wherein the first and second probes are further configured for traveling over the first and second surfaces of the structure, respectively, and wherein the probes cooperate by the magnetic coupling to move the respective magnetically coupled probe when the other probe is moved over the respective surface of the structure. 
   
   
     4. The apparatus of  claim 3 , wherein at least one probe further comprises a motor for moving the probes. 
   
   
     5. The apparatus of  claim 1 , wherein at least one probe further comprises a motion mechanism for supporting movement of one of the x-ray source or the x-ray detector. 
   
   
     6. The apparatus of  claim 5 , wherein the probe further comprises a motor for moving the x-ray source or the x-ray detector on the motion mechanism of the probe. 
   
   
     7. The apparatus of  claim 1 , wherein at least one probe further comprises a motor for moving one of the x-ray source or the x-ray detector of the probe. 
   
   
     8. The apparatus of  claim 1 , wherein the first probe is configured to permit adjustment of the incident angle of the radiation from the x-ray source with respect to the first surface of the structure. 
   
   
     9. The apparatus of  claim 1 , wherein at least one probe further comprises one or more vacuum suction cups for affixing the probe to the structure. 
   
   
     10. The apparatus of  claim 1 , wherein the magnetic coupling devices of the first and second probes are selected from the group consisting of a magnet and a ferromagnetic material insert. 
   
   
     11. The apparatus of  claim 1 , wherein the x-ray source comprises a microfocus x-ray tube and the x-ray detector comprises a CMOS x-ray detector. 
   
   
     12. The apparatus of  claim 1 , further comprising a display communicably coupled to the x-ray detector for presenting x-ray inspection images captured by the x-ray detector. 
   
   
     13. The apparatus of  claim 1 , wherein the x-ray detector comprises a wireless transmitter for transmitting x-ray inspection data. 
   
   
     14. A system for non-destructive inspection of a structure, comprising:
 a first probe configured for being positioned on a first surface of the structure under inspection, the first probe comprising:
 at least one magnetic coupling device; and 
 at least one x-ray source for emitting radiation for inspecting the structure when the first 
 
 probe is positioned on the first surface of the structure; 
 a second probe configured for being positioned on a second surface of the structure for through transmission inspection, the second probe comprising:
 at least one magnetic coupling device for magnetically coupling the second probe with the first probe, wherein the magnetic attraction of the magnetic coupling holds the first and second probes against the first and second surfaces of the structure; and 
 at least one x-ray detector for receiving the radiation and providing the received x-ray data for facilitating x-ray laminography inspection of the structure; and 
 
 a processing device communicably coupled to the x-ray detector for receiving x-ray data and adapted to reconstruct the received x-ray data into a 3-D representation of the structure. 
 
   
   
     15. The system of  claim 14 , wherein the processing device is further adapted to control movement of the x-ray source and x-ray detector for performing x-ray laminography inspection of the structure. 
   
   
     16. The system of  claim 14 , wherein the processing device is further adapted to control movement of the probes for performing computed laminography as the probes move over the opposing surfaces of the structure. 
   
   
     17. The system of  claim 14 , further comprising a wireless transmitter communicably connected to the x-ray detector and a wireless receiver communicably connected to the processing device for permitting wireless communication of x-ray data from the x-ray detector to the processing device. 
   
   
     18. A method of inspecting a structure comprising:
 supporting a first probe on a first surface of the structure and a second probe on an opposed second surface of the structure; 
 establishing magnetic attraction between the first and second probes sufficient for holding the probes on the first and second surfaces, respectively; and 
 inspecting the structure using an x-ray laminography inspection technique, wherein the inspection comprises repeatedly transmitting x-ray inspection signals from an x-ray source carried by one probe into the structure and receiving signals following propagation through the structure with an x-ray detector carried by the other probe. 
 
   
   
     19. The method of  claim 18 , wherein the step of inspecting the structure further comprises moving the x-ray source in conjunction with repeatedly transmitting x-ray inspection signals to obtain multiple inspection projections of the structure. 
   
   
     20. The method of  claim 19 , wherein the step of moving the x-ray source comprises moving the x-ray source in at least one of the motion paths selected from the group consisting of rotational-motion, translational-motion, and complex-motion. 
   
   
     21. The method of  claim 18 , further comprising the step of moving one probe, wherein magnetic coupling between the probes causes the other probe to be moved along the opposing surface of the structure. 
   
   
     22. The method of  claim 21 , wherein the step of inspecting the structure is performed while the probes are moved along the structure, whereby the x-ray inspection technique is a computed laminography x-ray inspection technique to inspect the structure. 
   
   
     23. The method of  claim 18 , further comprising the step of displaying x-ray inspection data. 
   
   
     24. The method of  claim 18 , further comprising the step of wirelessly transmitting x-ray inspection data from the x-ray detector. 
   
   
     25. The method of  claim 18 , wherein the first probe comprises the x-ray source and the method further comprises the step of adjusting the incident angle of the inspection signals from the x-ray source with respect to the first surface of the structure, and, optionally, adjusting the angle of the x-ray detector corresponding to the adjustment of the incident angle of the inspection signals.