P
US7071016B2ExpiredUtilityPatentIndex 73

Micro-electro mechanical systems (MEMS) device using silicon on insulator (SOI) wafer, and method of fabricating and grounding the same

Assignee: SAMSUNG ELECTRO MECHPriority: Nov 27, 2002Filed: Aug 11, 2004Granted: Jul 4, 2006
Est. expiryNov 27, 2022(expired)· nominal 20-yr term from priority
Inventors:PARK KYU-YEONKIM KI HOON
H10W 72/884H10W 90/724B81B 7/0006H10D 86/00
73
PatentIndex Score
9
Cited by
1
References
4
Claims

Abstract

An MEMS device using an SOI wafer includes a first silicon layer, an insulation layer formed on the first insulation layer, a second silicon layer formed an the insulation layer, a protective layer formed on the second silicon layer, and a ground hole extending from an upper portion of the protective layer to the first silicon layer and having a conductive material therein. A handle wafer in the MEMS device is connected to the ground hole without performing any additional wiring or bonding process.

Claims

exact text as granted — not AI-modified
1. A method for fabricating and grounding an MEMS device using an SOI wafer, comprising:
 a first step of preparing a first silicon layer; 
 a second step of forming an insulation layer on the first silicon layer; 
 a third step of forming a second silicon layer on the insulation layer and forming a plurality of slits and a predetermined structure on the second silicon layer, wherein the slits are formed to penetrate the second silicon layer at a location where a ground hole is to be formed; 
 a fourth step of forming a protective layer on the second silicon layer; 
 a fifth step of forming a signal hole and a ground hole in the protective layer and extending the ground hole to the first silicon layer through the second silicon layer and the insulation layer; and 
 a sixth step of forming a conductive material layer in the ground hole. 
 
   
   
     2. The method as set forth in  claim 1 , wherein the fifth step comprises etching the second silicon layer and the insulation layer in the ground hole, thereby extending the ground hole to the first silicon layer. 
   
   
     3. The method as set forth in  claim 1 , wherein the fifth step comprises injecting sand power into the ground hole, thereby extending the ground hole to the first silicon layer through the second silicon layer and the insulation layer. 
   
   
     4. The method as set forth in  claim 3 , wherein the sand powder is injected into the ground hole through sand blaster nozzles.

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