Universal test fixture

Abstract

A universal fixture for testing a device, such as a bare printed circuit board, includes a plurality of addressable contact points. Each of the contact points includes a switch connected to a conductor capable of creating an electrical connection to the device. To obtain a measurement of a target on the device, two of the contact points on the universal fixture are selected based on the position of the target on the device relative to the contact points.

1. A universal fixture for testing an electronic device, comprising:
 a plurality of addressable contact points, each of said contact points including a conductor for creating an electrical connection to said device, and each of said contact points further including a switch connected to said conductor thereof; 
 wherein two of said contact points are selected contact points for obtaining a measurement of a target on said device; 
 wherein the selection of said selected contact points is configurable based on a position of said target on said device relative to said contact points; and 
 wherein a current is sourced through said target via said selected contact points when each said switch in each of said selected contact points is in a same state. 
 
   
   
     2. The universal fixture according to  claim 1 , wherein said plurality of addressable contact points are arranged in an array having rows and columns. 
   
   
     3. The universal fixture according to  claim 2 , wherein the spacing between adjacent ones of said conductors is smaller than the spacing between adjacent targets on said device. 
   
   
     4. The universal fixture according to  claim 1 , wherein a current is sourced through said target and a voltage is measured across said target when each said switch in each of said selected contact points is in said same state. 
   
   
     5. The universal fixture according to  claim 1 , wherein said device is a bare printed circuit board. 
   
   
     6. The universal fixture according to  claim 1 , wherein said universal fixture includes a first universal fixture and a second universal fixture, said device being sandwiched between said first universal fixture and said second universal fixture. 
   
   
     7. The universal fixture according to  claim 1 , wherein said switch includes at least one thin film transistor. 
   
   
     8. The universal fixture according to  claim 1 , wherein each said switch of said selected contact points includes a first switch for sourcing a current through said target when said first switch is in said same state and a second switch for measuring a voltage across said target when said second switch is in said same state. 
   
   
     9. A testing system for testing an electronic device, comprising:
 a universal fixture including a plurality of addressable contact points, each of said contact points including a conductor for creating an electrical connection to said device, and each of said contact points further including a switch connected to said conductor thereof; and 
 a processor connected to said universal fixture for selecting two of said contact points as selected contact points to obtain a measurement of a target on said device, the selection being based on a position of said target on said device relative to each of said contact points; 
 wherein a current is sourced through said target via said selected contact points when each said switch in each of said selected contact points is in a same state. 
 
   
   
     10. The testing system according to  claim 9 , wherein said processor is adapted for configuring said universal fixture to simultaneously obtain measurement of multiple targets on said device. 
   
   
     11. The testing system according to  claim 9 , further comprising:
 a current source connected to source a known current through said target via said selected contact points; and 
 a voltmeter connected to measure a voltage across said target via said selected contact points. 
 
   
   
     12. The testing system according to  claim 11 , wherein each said switch of said selected contact points includes a first switch for sourcing a current through said target when said first switch is in said same state and a second switch for measuring a voltage across said target when said second switch is in said same state. 
   
   
     13. The testing system according to  claim 9 , wherein said universal fixture includes a first universal fixture and a second universal fixture, each being connected to said processor, said device being sandwiched between said first universal fixture and said second universal fixture. 
   
   
     14. The testing system according to  claim 9 , wherein said device is a bare printed circuit board. 
   
   
     15. The testing system according to  claim 9 , wherein said switch includes at least one thin film transistor. 
   
   
     16. The testing system of  claim 9 , wherein said plurality of addressable contact points are arranged in an array having rows and columns. 
   
   
     17. The testing system according to  claim 16 , wherein the spacing between adjacent ones of said conductors is smaller than the spacing between adjacent targets on said device. 
   
   
     18. A method for testing an electronic device, comprising:
 providing a universal fixture including a plurality of addressable contact points, each of said contact points including a switch connected to a conductor that creates an electrical connection to said device; 
 selecting two of said contact points as selected contact points to obtain a measurement of a target on said device based on a position of said target on said device relative to said contact points; and 
 sourcing current through said target via said selected contact points when each said switch in each of said selected contact points is in a same state. 
 
   
   
     19. The method according to  claim 18 , further comprising:
 sourcing said current through said target using a first switch in each of said selected contact points; and 
 measuring a voltage across said target using a second switch in each of said selected contact points. 
 
   
   
     20. The method according to  claim 18 , wherein said selecting comprises:
 mapping target locations on said device to contact point locations on said universal fixture to select said selected contact points. 
 
   
   
     21. A universal fixture for testing an electronic device, comprising:
 a plurality of addressable contact points, each of said contact points including for creating an electrical connection to said device, and each of said contact points further including a switch connected to said conductor thereof; 
 wherein two of said contact points are selected contact points for obtaining a measurement of a target on said device; 
 wherein the selection of said selected contact points is configurable based on a position of said target on said device relative to said contact points; and 
 wherein each said switch of said selected contact points includes a first switch for sourcing a current through said target when said first switch is in a first state and a second switch for measuring a voltage across said target when said second switch is in said first state. 
 
   
   
     22. A method for testing an electronic device, comprising:
 providing a universal fixture including a plurality of addressable contact points, each of said contact points including a switch connected to a conductor that creates an electrical connection to said device; 
 selecting two of said contact points as selected contact points to obtain a measurement of a target on said device based on a position of said target on said device relative to said contact points; 
 sourcing a current through said target using a first switch in each of said selected contact points; and 
 measuring a voltage across said target using a second switch in each of said selected contact points. 
 
   
   
     23. A universal fixture apparatus for testing an electronic device, comprising:
 a first universal fixture; and 
 a second universal fixture; 
 wherein each of said first and second universal fixtures comprises a plurality of addressable contact points, each of said contact points including a conductor for creating an electrical connection to said device, and each of said contact points further including a switch connected to said conductor thereof, wherein two of said contact points of each of said first and second universal fixtures are selected contact points for obtaining a measurement of a target on said device, wherein the selection of said selected contact points is configurable based on a position of said target on said device relative to said contact points, and wherein said first and second universal fixtures are adapted to receive said device sandwiched therebetween.