US7235185B2ExpiredUtilityPatentIndex 62
Method of protecting wafer front pattern and method of performing double-sided process
Est. expiryJul 29, 2025(expired)· nominal 20-yr term from priority
Inventors:CHEN I-JU
B81C 1/00896Y10S438/928B81C 2201/053
62
PatentIndex Score
4
Cited by
7
References
7
Claims
Abstract
A wafer comprising a front surface and a back surface is provided. The wafer further includes a front pattern on the front surface, the front pattern having a plurality of holes. A low-viscosity fluid is formed on the front surface and filled into the holes. Following that, a high-viscosity fluid is formed and filled into the holes by diffusion.
Claims
exact text as granted — not AI-modified1. A method of performing double-sided process capable of protecting a wafer front pattern, the method comprising:
providing a wafer comprising a front surface and a back surface;
performing a front process to form a front pattern on the front surface, the front pattern having a plurality of holes;
forming a first photoresist solution on the front surface of the wafer, the first photoresist solution being filled into the holes;
forming a second photoresist solution on the front surface of the wafer, the second photoresist solution being filled into the holes by diffusion; and
attaching the front surface of the wafer to a supporting carrier and performing a back process on the back surface of the wafer.
2. The method of claim 1 , further comprising performing a heating process to expel the first photoresist solution from the holes after filling the second photoresist solution into the holes.
3. The method of claim 2 , wherein the heating process is performed gradually.
4. The method of claim 1 , wherein the first photoresist solution has a viscosity index of between 10 and 50 centipoise (cP).
5. The method of claim 1 , wherein the second photoresist solution has a viscosity index between 100 and 800 cP.
6. The method of claim 1 , wherein the first photoresist solution has a smaller viscosity index than the second photoresist solution.
7. The method of claim 2 , wherein the heating process further solidifies the second photoresist solution to form a protecting cap to protect the front pattern.Cited by (0)
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