Circuit component tester

Abstract

A circuit component tester includes a portable casing and a circuit provided within the casing. A plurality of leads are provided to electrically connect the circuit to a gate and two terminals of a circuit component under test. A test switch provided on the casing initiates application of test voltage to at least one of the two terminals of the circuit component under test. A gate switch provided on the casing initiates application of gate voltage to the gate of the circuit component under test. At least one of the test switch and the gate switch are operable to verify functionality of the circuit component under test.

1. A circuit component tester, comprising:
 a portable casing; 
 a circuit provided within the casing; 
 a plurality of leads for electrically connecting the circuit to a gate and two terminals of a circuit component under test; 
 at least one switch provided on the casing to initiate application of test voltage to at least one of the two terminals of the circuit component under test and to initiate application of gate voltage to the gate of the circuit component under test, 
 wherein the at least one switch is operable to verify functionality of the circuit component under test. 
 
   
   
     2. The circuit component tester of  claim 1 , the plurality of leads further comprising:
 a first test lead arranged in a path between a positive side of a test battery and a second test lead. 
 
   
   
     3. The circuit component tester of  claim 2 , the circuit further comprising:
 a voltage divider network arranged between the second test lead and a negative side of the test battery; and 
 a first light emitting diode and a second light emitting diode aligned oppositely and arranged in parallel to the first light emitting diode. 
 
   
   
     4. The circuit component tester of  claim 3 , the voltage divider network further comprising:
 a first resistor and a second resistor arranged in parallel with the first resistor; and 
 a third resistor arranged between the negative side of the test battery and the parallel first resistor and second resistor. 
 
   
   
     5. The circuit component tester of  claim 4 ,
 wherein values of the first resistor and the second resistor are substantially equal. 
 
   
   
     6. The circuit component tester of  claim 4 , the at least one switch further comprising:
 a test switch to initiate the application of test voltage to at least one of the two terminals of the circuit component under test; and 
 a gate switch to initiate the application of gate voltage to the gate of the circuit component under test. 
 
   
   
     7. The circuit component tester of  claim 6 ,
 wherein the first light emitting diode and the second light emitting diode are arranged in parallel to the first resistor and the second resistor. 
 
   
   
     8. The circuit component tester of  claim 7 , the circuit further comprising:
 a fourth resistor arranged between a positive terminal of a gate battery and a gate lead. 
 
   
   
     9. The circuit component tester of  claim 8 , the circuit further comprising:
 a third light emitting diode and a fourth light emitting diode aligned oppositely and arranged in parallel to the third light emitting diode. 
 
   
   
     10. The circuit component tester of  claim 8 , wherein voltage values of the batteries and resistance values of the first resistor, second resistor, third resistor and fourth resistor are selected to generate a test current within a specification of the circuit component under test. 
   
   
     11. The circuit component tester of  claim 9 ,
 wherein the parallel third light emitting diode and fourth light emitting diode are arranged between the fourth resistor and the gate lead. 
 
   
   
     12. The circuit component tester of  claim 9 ,
 wherein one of the first and second light emitting diodes is activated when the test switch is moved to a forward position. 
 
   
   
     13. The circuit component tester of  claim 12 ,
 wherein the other of the first and second light emitting diodes is activated when the test switch is moved to a reverse position. 
 
   
   
     14. The circuit component tester of  claim 13 ,
 wherein one of the third and fourth light emitting diodes is activated when the gate switch is moved to a positive position. 
 
   
   
     15. The circuit component tester of  claim 14 ,
 wherein the other of the third and fourth light emitting diodes is activated when the gate switch is moved to a negative position. 
 
   
   
     16. The circuit component tester of  claim 15 ,
 wherein the circuit component under test is determined to function properly when the one of the first and second light emitting diodes remains activated after the gate switch is moved to an off position and the one of the third and fourth light emitting diodes is resultantly inactivated. 
 
   
   
     17. A method of testing circuit components, comprising:
 connecting a plurality of leads for electrically connecting a circuit of a circuit component tester to a gate and two terminals of a circuit component under test; 
 activating a test switch provided on a portable casing to initiate application of a test voltage to at least one of two terminals of a circuit component under test; and 
 activating a gate switch provided on the portable casing to initiate application of a gate voltage to a gate of the circuit component under test, 
 wherein at least one of the test switch and the gate switch are operable to verify functionality of the circuit component under test. 
 
   
   
     18. The method of testing circuit components of  claim 17 , further comprising:
 verifying that one of a plurality of light emitting diodes on the circuit component tester illuminates in response to at least one of activating the test switch and activating the gate switch. 
 
   
   
     19. The method of testing circuit components of  claim 18 , further comprising:
 reversing at least one of the test switch and the gate switch, and verifying that at least one of the plurality of light emitting diodes changes illumination status in response. 
 
   
   
     20. A circuit of a circuit component tester, the circuit comprising:
 a plurality of leads for electrically connecting the circuit to a gate and two terminals of a circuit component under test; 
 a test switch that is moved to initiate application of test voltage to at least one of the two terminals of the circuit component under test; 
 a gate switch that is moved to initiate application of gate voltage to the gate of the circuit component under test; and 
 a plurality of light emitting diodes that illuminate in response to the movement of at least one of the test switch and the gate switch when the circuit component under test operates properly, 
 wherein at least one of the test switch and the gate switch are operable to verify functionality of the circuit component under test. 
 
   
   
     21. The circuit of a circuit component tester of  claim 20 ,
 wherein the circuit component under test is one of a silicon controlled rectifier and a triac.