Methods and apparatus for testing a component

Abstract

A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.

1. A method for inspecting a component, said method comprising:
 generating a scan plan of a component to be inspected; 
 coupling a side-mount probe to an eddy current inspection system; 
 inducing an eddy current into the component; 
 measuring the eddy current in the component to generate a plurality of scan data; and 
 analyzing the scan data to generate at least one image of the component being inspected. 
 
     
     
       2. A method in accordance with  claim 1  wherein coupling a side-mount probe to an eddy current inspection system further comprises coupling a side-mount probe to the eddy current inspection system, the probe includes a body portion comprising an outer surface, said body portion having a width and a length that is longer than the width, and a tip portion extending from the body portion, the tip portion comprising an end and an outer tip, the end extending between the body portion and the outer tip, the tip portion having a width and a length wherein the width gradually decreases from the end to the outer tip, the second length gradually decreases from the end to the outer tip. 
     
     
       3. A method in accordance with  claim 2  further comprising coupling a side-mount probe to the eddy current inspection system, the side-mount probe includes at least two coils mounted within the tip portion, each of the at least two coils comprising a substantially cylindrical shape, at least a portion of each of the coils is positioned adjacent to the tip portion outer tip for generating a magnetic field that is substantially perpendicular to a surface of the component being inspected. 
     
     
       4. A method in accordance with  claim 1  wherein measuring the eddy current further comprises positioning the eddy current probe at an angle that is greater than approximately 5 degrees to a normal surface of the component being inspected. 
     
     
       5. A method in accordance with  claim 1  wherein generating a scan plan further comprises generating a plurality of computer numeric control commands. 
     
     
       6. A method in accordance with  claim 1  wherein analyzing the scan data further comprises utilizing the scan data to generate at least one two-dimensional image of the component being inspected. 
     
     
       7. A method in accordance with  claim 6  further comprising dividing the two-dimensional image into a plurality of sub-images that each have approximately the same shape. 
     
     
       8. A method in accordance with  claim 7  further comprising processing at least one sub-image to facilitate reducing signals acquired from at least one of a component edge and a component gap using a registration and subtraction process to generate a third image. 
     
     
       9. A method in accordance with  claim 8  further comprising selecting a filter based on the third image generated and filtering the third image to generate a final image. 
     
     
       10. A side-mount eddy current probe for inspecting a component, said eddy current probe comprising:
 a body portion comprising an outer surface and having a width, and a length that is longer than said width; and 
 a tip portion extending from said body portion, said tip portion comprising an end and an outer tip, said end extending between said body portion and said outer tip, said tip portion having a width and a length, said tip portion width gradually decreases from said tip portion end to said outer tip, said tip portion length gradually decreases from said tip portion end to said outer tip. 
 
     
     
       11. An eddy current probe in accordance with  claim 10  further comprising at least two coils mounted within said tip portion, each of said at least two coils comprises a substantially cylindrical shape, at least a portion of each of said at least two coils is positioned adjacent to said tip portion outer tip for generating a magnetic field that is substantially perpendicular to a surface of the component being inspected. 
     
     
       12. An eddy current probe in accordance with  claim 10  further comprising at least two side-mount coils mounted within said tip portion, each of said at least two side-mount coils comprises a substantially cylindrical shape, at least a portion of each said side-mount coil is positioned adjacent to said tip portion outer tip for generating a magnetic field that is substantially perpendicular to a surface of the component being scanned. 
     
     
       13. An eddy current probe in accordance with  claim 10  wherein said body portion and said tip portion are formed unitarily together. 
     
     
       14. An eddy current inspection system comprising:
 an eddy current probe comprising: 
 a body portion comprising an outer surface and having a width, and a length that is longer than said width; and 
 a tip portion extending from said body portion, said tip portion comprising an end and an outer tip, said end extending between said body portion and said outer tip, said tip portion having a width and a length, said tip portion width gradually decreases from said end to said outer tip, said tip portion length gradually decreases from said end to said outer tip; and 
 a data acquisition/control system coupled to said eddy current probe and configured to record an output received from said eddy current probe. 
 
     
     
       15. A system in accordance with  claim 14  wherein said component is a gas turbine engine component. 
     
     
       16. A system in accordance with  claim 14  wherein said eddy current probe further comprises at least two coils mounted within said tip portion, each of said at least two coils that each comprise a substantially cylindrical shape, at least a portion of said at least two coils is positioned adjacent to said tip portion outer tip for generating a magnetic field that is substantially perpendicular to a surface of the component being inspected. 
     
     
       17. A system in accordance with  claim 14  wherein said data acquisition/control system is further configured to generate a plurality of computer numeric control commands. 
     
     
       18. A system in accordance with  claim 14  wherein said data acquisition/control system is further configured to utilize the scan data to generate at least one two-dimensional image of the component. 
     
     
       19. A system in accordance with  claim 18  wherein said data acquisition/control system is further configured to divide the at least one two-dimensional image into a plurality of sub-images that each have approximately the same shape, and process at least one sub-image to facilitate reducing signals acquired from at least one of a component edge and a component gap using a registration and subtraction process to generate a third image. 
     
     
       20. A system in accordance with  claim 19  wherein said data acquisition/control system is further configured to select a filter based on the third image generated and filtering the third image to generate a final image.