US7795918B2ActiveUtilityPatentIndex 51
Adjusting output buffer timing based on drive strength
Est. expiryAug 16, 2027(~1.1 yrs left)· nominal 20-yr term from priority
Inventors:GRABER JOEL J
H03K 19/00384H03K 19/00376
51
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Claims
Abstract
This invention operates to select a drive code for an adjustable drive strength transistor in a drive buffer. The drive code is determined employing a scaled-down drive transistor employing varying drive codes compared with a standard. The thus determined drive code is combined with an offset to generate the drive code for the adjustable strength transistor.
Claims
exact text as granted — not AI-modified1. A method of setting an adjustable buffer drive strength including the steps of:
comparing a scaled-down drive transistor having a predetermined relationship to an actual drive transistor to a standard at a plurality of drive strengths;
selecting one drive strength upon detection of a predetermined relationship between the scaled-down drive transistor at said one drive strength and said standard;
determining an offset drive strength to said one drive strength;
combining said one drive strength and said offset drive strength to determine an actual drive strength for the actual drive transistor; and
setting the drive strength of the actual drive transistor as said determined actual drive strength.
2. The method of claim 1 , wherein:
said step of comparing a scaled-down drive transistor to the standard at a plurality of drive strengths includes
causing a digital code source to select minimal drive for drive transistor;
setting a test drive strength to a minimum drive strength,
comparing a voltage across a reference resistor driven by said scaled-down drive transistor at a current drive strength with a standard voltage,
if a comparison has a first predetermined result, selecting the current drive strength as said one drive strength; or
if a comparison has a second predetermined result opposite to the first predetermined result, advancing a the current drive strength to a next sequential drive strength and repeating said comparing until a comparison has a first predetermined result.
3. The method of claim 1 , wherein:
said step of determining an offset drive strength includes receiving a user input specifying the offset drive strength.
4. The method of claim 1 , wherein:
said step of determining an offset drive strength includes
classifying the actual drive transistor, and
recalling an offset drive strength from a look-up table at an entry corresponding to said classification of the actual drive transistor.
5. The method of claim 1 , further comprising:
performing said steps of comparing, selecting, determining, combining and setting a first time for a P-channel actual drive transistor; and
performing said steps of comparing, selecting, determining, combining and setting a second time for an N-channel actual drive transistor.
6. A buffer having an adjustable drive strength corresponding to a digital code comprising:
a standard voltage generator;
a comparison voltage generator including a resistor having a predetermined resistance and a scaled-down drive transistor having an adjustable drive strength corresponding to said digital code, said scaled-down transistor having a predetermined relationship to an actual drive transistor;
an analog comparator comparing said standard voltage and said comparison voltage;
a digital code source;
a test controller operable to
initially cause said digital code source to supply a minimal digital code to said scaled-down drive transistor causing said digital code source to select a minimal drive strength,
cause said digital code source to supply a next sequential digital code to said scaled-down drive transistor if said analog comparator indicates a first predetermined comparison result, and
select a current digital code to supply said actual drive transistor in said buffer if said analog comparator indicates a second predetermined comparison result opposite to said first predetermined comparison result; and
an add/subtract unit having a first input receiving said selected current digital code, a second input receiving user input offset data and an output generating a sum of said selected current digital code and said user input offset data controlling the drive strength of the adjustable drive strength buffer.
7. The buffer of claim 6 , wherein:
said scaled-down drive transistor consists of a P-channel transistor; and
said buffer further comprising:
a second scaled-down transistor consisting of an N-channel transistor, said second scaled-down transistor having a predetermined relationship to a second actual drive transistor,
a second analog comparator comparing said standard voltage and said comparison voltage,
a second digital code source, and
a second test controller operable to
initially cause said second digital code source to supply the minimal digital code to said scaled-down drive transistor causing said second digital code source to select the minimal drive strength,
cause said second digital code source to supply a next sequential digital code to said second scaled-down drive transistor if said second analog comparator indicates said first predetermined comparison result, and
select a second current digital code to supply said second actual drive transistor in said buffer if said second analog comparator indicates said second predetermined comparison result; and
a second add/subtract unit having a first input receiving said second selected current digital code, a second input receiving said user input offset data and an output generating a sum of said second selected current digital code and said user input offset data controlling the drive strength of a second adjustable drive strength buffer.Cited by (0)
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