Slit disk for modified faraday cup diagnostic for determining power density of electron and ion beams

Abstract

A diagnostic system for characterization of an electron beam or an ion beam includes an electrical conducting disk of refractory material having a circumference, a center, and a Faraday cup assembly positioned to receive the electron beam or ion beam. At least one slit in the disk provides diagnostic characterization of the electron beam or ion beam. The at least one slit is located between the circumference and the center of the disk and includes a radial portion that is in radial alignment with the center and a portion that deviates from radial alignment with the center. The electron beam or ion beam is directed onto the disk and translated to the at least one slit wherein the electron beam or ion beam enters the at least one slit for providing diagnostic characterization of the electron beam or ion beam.

1. A diagnostic apparatus for characterization of an electron beam or an ion beam, comprising:
 an electrical conducting disk of refractory material, said disk having a circumference and a center; and 
 at least one slit in said disk for providing diagnostic characterization of the electron beam or ion beam; 
 said at least one slit located between said circumference and said center, 
 said at least one slit having a first radial portion that is in radial alignment with said center, and 
 said at least one slit having a second portion that deviates from radial alignment with said center. 
 
     
     
       2. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 1  wherein said second portion that deviates from radial alignment with said center is a bent portion that deviates from radial alignment with said center. 
     
     
       3. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 2  wherein said bent portion is bent at a point substantially halfway from said center to said circumference. 
     
     
       4. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 2  wherein said disk has a number of slits with an angle between said slits and wherein said angle is determined by dividing 360° by said number of slits. 
     
     
       5. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 2  wherein said disk has a number of slits with an angle between said slits and wherein said bent portion is bent at an angle equal to one fourth said angle between said slits. 
     
     
       6. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 2  wherein said disk has a number of slits that provide a number of sections between said number of slits and wherein said bent portion has a bent portion angle and wherein said bent portion angle is determined the formula (360°/n)/(2 m) where n=said number of slits and m=said number of sections. 
     
     
       7. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 1  including a beam block for receiving the electron beam or an ion beam. 
     
     
       8. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 1  wherein said second portion that deviates from radial alignment with said center is a crooked portion that deviates from radial alignment with said center. 
     
     
       9. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 8  including a third portion that is in radial alignment with said center and wherein said crooked portion connects said first portion and said third portion. 
     
     
       10. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 1  wherein said disk has a number of slits with an angle between said slits and wherein said angle is determined by dividing 360° by said number of slits. 
     
     
       11. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 8  including a beam block for receiving the electron beam or an ion beam. 
     
     
       12. A diagnostic apparatus for characterization of an electron beam or an ion beam utilizing a Faraday cup assembly, comprising:
 an electrical conducting disk of refractory material, said disk having a circumference and a center; and 
 at least one slit in said disk for providing diagnostic characterization of the electron beam or ion beam, wherein the electron beam or ion beam is directed through said at least one slit in said disk to the Faraday cup assembly; 
 said at least one slit located between said circumference and said center, 
 said at least one slit having a first radial portion that is in radial alignment with said center, and 
 said at least one slit having a second portion that deviates from radial alignment with said center. 
 
     
     
       13. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 12  including a beam block for receiving the electron beam or an ion beam. 
     
     
       14. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 12  wherein said disk has a number of slits with an angle between said slits and wherein said angle is determined by dividing 360° by said number of slits. 
     
     
       15. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 12  wherein said disk has a number of slits with an angle between said slits and wherein said bent portion is bent at an angle equal to one fourth said angle between said slits. 
     
     
       16. The diagnostic apparatus for characterization of electron beam or ion beam of  claim 12  wherein said disk has a number of slits that provide a number of sections between said number of slits and wherein said bent portion has a bent portion angle and wherein said bent portion angle is determined the formula (360°/n)/(2 m) where n=said number of slits and m=said number of sections. 
     
     
       17. A diagnostic method of characterizing an electron beam or an ion beam, comprising the steps of:
 providing an electrical conducting disk of refractory material having a circumference and a center with at least one slit in said disk for providing diagnostic characterization of the electron beam or ion beam, said at least one slit located between said circumference and said center of said disk, said at least one slit having a first radial portion that is in radial alignment with said center, and said at least one slit having a second portion that deviates from radial alignment with said center; 
 providing a Faraday cup assembly located below said disk and positioned to receive the electron beam or ion beam; and 
 directing the electron beam or ion beam onto said disk and translating the electron or ion beam to said at least one slit wherein portions of the electron beam or ion beam enters said at least one slit and is received by said Faraday cup assembly for providing diagnostic characterizing of the electron beam or ion beam. 
 
     
     
       18. The diagnostic method of characterizing an electron beam or an ion beam of  claim 17  wherein said step of providing an electrical conducting disk of refractory material includes providing a number of slits in said disk with an angle between said slits and wherein said angle is determined by dividing 360° by said number of slits. 
     
     
       19. The diagnostic method of characterizing an electron beam or an ion beam of  claim 17  wherein said step of providing an electrical conducting disk of refractory material having a circumference and a center with at least one slit in said disk for providing diagnostic characterization of the electron beam or ion beam, said at least one slit located between said circumference and said center of said disk, said at least one slit having a first radial portion that is in radial alignment with said center, and said at least one slit having a second portion that deviates from radial alignment with said center includes providing a bent portion that deviates from radial alignment with said center and wherein said bent portion is bent at a point substantially halfway from said center to said circumference. 
     
     
       20. A diagnostic method of characterizing an electron beam or an ion beam utilizing a Faraday cup assembly, comprising the steps of:
 providing an electrical conducting disk of refractory material having a circumference and a center with at least one slit in said disk for providing diagnostic characterization of the electron beam or ion beam, said at least one slit located between said circumference and said center of said disk, said at least one slit having a first radial portion that is in radial alignment with said center, and said at least one slit having a second portion that deviates from radial alignment with said center; and 
 directing the electron beam or ion beam onto said disk and translating the electron or ion beam to said at least one slit wherein portions of the electron beam or ion beam enters said at least one slit and is received by the Faraday cup assembly for providing diagnostic characterizing of the electron beam or ion beam.