Laser annealing method and laser annealing device
Abstract
The energy distribution in the short-side direction of a rectangular laser beam applied to an amorphous semiconductor film (amorphous silicon film) is uniformized. It is possible to the energy distribution in the short-side direction of the rectangular laser beam by the use of a cylindrical lens array 26 or a light guide 36 and concentrating optical systems 28 and 44 or by the use of an optical system including a diffracting optical element. Accordingly, since the effective energy range of a laser beam applied to the amorphous semiconductor film is widened and the transport speed of a substrate 3 can be enhanced as much, it is possible to improve the processing ability of the laser annealing.
Claims
exact text as granted — not AI-modified1. A laser annealing method of reforming an amorphous semiconductor film into a polycrystalline semiconductor film by concentrating a laser beam emitted from a solid laser source into a rectangular laser beam on a surface of the amorphous semiconductor film and applying the rectangular laser beam thereto while moving the rectangular laser beam relative to the amorphous semiconductor film in a short-side direction of the rectangular laser beam, comprising:
uniformizing an energy distribution in the short-side direction of the rectangular laser beam by dividing the laser beam into divided laser beams through a light guide and focusing the divided laser beams through a Y-direction end transferring optical system including two cylindrical lenses; and
applying the rectangular laser beam to the amorphous semiconductor film,
wherein a Y-direction coherence reducing optical system, which includes a first transparent glass plate and a second transparent glass plate, is provided between the two cylindrical lenses, and
wherein a length of the first transparent glass plate is different from a length of the second transparent glass plate.
2. A laser annealing device for reforming an amorphous semiconductor film into a polycrystalline semiconductor film by concentrating a laser beam emitted from a solid laser source into a rectangular laser beam on a surface of the amorphous semiconductor film and applying the rectangular laser beam thereto while moving the rectangular laser beam relative to the amorphous semiconductor film in a short-side direction of the rectangular laser beam, comprising:
a short-side-direction uniformizing means for uniformizing an energy distribution in a short-side direction of the rectangular laser beam, short-side-direction uniformizing means being disposed in an optical path of the laser beam, wherein the short-side-direction uniformizing means includes:
a light guide; and
a Y-direction end transferring optical system, which includes two cylindrical lenses, through which laser beams divided by the light guide pass; and
a Y-direction coherence reducing optical system, which includes a first transparent glass plate and a second transparent glass plate, between the two cylindrical lenses, and
wherein a length of the first transparent glass plate is different from a length of the second transparent glass plate.
3. The laser annealing device according to claim 2 ,
wherein the light guide is formed of a transparent member having a solid parallel hexahedral shape, and includes X-direction reflecting surfaces facing each other with a distance therebetween in an X-direction, and Y-direction reflecting surfaces facing each other with a distance therebetween in a Y-direction.
4. The laser annealing device according to claim 2 ,
wherein the short-side-direction uniformizing means is an optical system including a diffracting optical element.
5. The laser annealing device according to claim 2 ,
wherein the amorphous semiconductor film is an amorphous silicon film.
6. The laser annealing device according to claim 2 ,
wherein the solid laser source is one of an Nd:YAG laser, an Nd:YLF laser, an Nd:YVO 4 laser, an Nd:glass laser, an Yb:YAG laser, an Yb:YLF laser, an Yb:YVO 4 laser, and an Yb:glass laser.
7. The laser annealing device according to claim 2 , wherein an energy distribution of the rectangular laser beam has a flat top shape having an energy of 430 mJ/cm 2 or more and having a width of 50 μm or more.
8. The laser annealing device according to claim 2 , wherein a difference between the length of the first transparent glass plate and the length of the second transparent glass plate is more than a coherent length of the laser beam.
9. The laser annealing device according to claim 2 , further comprising:
an X-direction end transferring optical system, which includes a first cylindrical lens and a second cylindrical lens, between the two cylindrical lenses; and
an X-direction coherence reducing optical system, which includes a third glass plate and a fourth glass plate, between the first cylindrical lens and the second cylindrical lens,
wherein the X-direction coherence reducing optical system and the Y-direction coherence reducing optical system are between the first cylindrical lens and the second cylindrical lens.
10. The laser annealing device according to claim 2 , wherein the overlap ratio of the rectangular laser beam is 91 to 95%.
11. The laser annealing device according to claim 2 , wherein a length in the short-side direction of the rectangular laser beam is several tens of micrometers (μm).
12. The laser annealing device according to claim 2 , further comprising:
a beam expander including a concave spherical lens between the solid laser source and the light guide; and
an incidence lens between the beam expander and the light guide.Cited by (0)
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