P
US8238698B2ActiveUtilityPatentIndex 23

Optical measuring probe for process monitoring

Assignee: TOSCH STEPHANPriority: Aug 2, 2006Filed: Jul 20, 2007Granted: Aug 7, 2012
Est. expiryAug 2, 2026(~0.1 yrs left)· nominal 20-yr term from priority
Inventors:TOSCH STEPHANGROSS REINHARDBRAND MARCUSTUPS HANS
G01N 21/474G02B 23/2492G01N 21/359G02B 23/26G01N 21/8507G02B 23/2476G01N 21/15
23
PatentIndex Score
0
Cited by
10
References
4
Claims

Abstract

The invention relates to an optical measurement probe for process monitoring, having a distal end, arranged in the region of a process apparatus, with a light entrance opening, and a proximal end coupled to a spectrometer, wherein a shaft comprising a light-guiding connection between the distal and proximal ends of the measurement probe is arranged between the two ends. The measurement probe is characterized in that the measurement probe has, in its distal region relative to the shaft and/or the proximal end, a reduced external diameter (FIG. 1 ).

Claims

exact text as granted — not AI-modified
1. Optical reflection measurement probe ( 10 ) for process monitoring of a material in a medium, comprising
 a) a distal end ( 11 ) with a light entrance opening ( 12 ), 
 b) a proximal end ( 13 ) coupled to an evaluation device, 
 c) a rigid sleeve ( 14 ) comprising a first light-guiding connection between the distal and proximal ends of the measurement probe, arranged between the two ends, wherein the light guiding connection involves fibre-optic waveguides or optical waveguide bundles without any flexible sheathing and wherein 
 (d) the measurement probe has, in its distal region ( 11 ) relative to the rigid sleeve ( 14 ) and/or the proximal end ( 13 ), a reduced external diameter,
 wherein a transition between the rigid sleeve ( 14 ) and the distal region is conically shaped for reducing contamination, 
 wherein the measurement probe has a purging device ( 15 ) with a purging duct arranged in the rigid sleeve ( 14 ) and with a purging opening ( 16 ) arranged in the distal end, proximate to the light entrance opening, 
 wherein the purging duct conveys the same medium as the medium used in the process that is being monitored, 
 wherein the purging can be carried out continuously, at fixed intervals or if cleaning is required and 
 wherein the purging device creates pulsed purges or high-pressure purges. 
 
 
     
     
       2. Optical measurement probe according to  claim 1 , wherein the measurement probe further comprises
 a) a second light-guiding connection ( 17 ) for coupling in measurement light of a light source with a known spectrum 
 b) and a light exit opening ( 18 ) in the distal region of the measurement probe. 
 
     
     
       3. Optical measurement probe according to  claim 1 , wherein the measurement probe is designed for reflection measurements in the NIR range. 
     
     
       4. Optical measurement probe according to  claim 1 , wherein the reduced diameter of the shaft ( 14 ) is about 2.0 mm and the rigid sleeve is about 12 mm.

Cited by (0)

No later patents cite this yet.

References (0)

No backward citations on record.