US8367448B2ActiveUtilityPatentIndex 63
Capacitor and organic light emitting display device
Est. expiryMar 12, 2030(~3.7 yrs left)· nominal 20-yr term from priority
H10D 1/692H10D 86/481H10D 86/423H10D 86/60H10K 59/1216H10K 59/1213
63
PatentIndex Score
4
Cited by
20
References
13
Claims
Abstract
A capacitor of an organic light emitting display device includes a first metal layer on a substrate, a first insulating layer on the first metal layer, an oxide semiconductor layer on the first insulating layer, the oxide semiconductor layer corresponding to the first metal layer, a second insulating layer on the first insulating layer, the second insulating layer including an opening exposing a portion of the oxide semiconductor layer, and a second metal layer on the second insulating layer and in the opening, the second metal layer being connected to the exposed portion of the oxide semiconductor layer.
Claims
exact text as granted — not AI-modified1. A capacitor of an organic light emitting display device, the capacitor comprising:
a first metal layer on a substrate;
a first insulating layer on the first metal layer;
an oxide semiconductor layer on the first insulating layer, the oxide semiconductor layer corresponding to the first metal layer;
a second insulating layer on the first insulating layer, the second insulating layer including an opening exposing a portion of the oxide semiconductor layer; and
a second metal layer on the second insulating layer and in the opening, the second metal layer being connected to the exposed portion of the oxide semiconductor layer.
2. The capacitor as claimed in claim 1 , wherein the second insulating layer covers edge portions of the oxide semiconductor layer and exposes a center portion of the oxide semiconductor layer through the opening.
3. The capacitor as claimed in claim 1 , wherein the opening in the second insulating layer exposes a majority of an upper surface of the oxide semiconductor layer.
4. The capacitor as claimed in claim 3 , wherein a contact surface between the second metal layer and the oxide semiconductor layer overlaps an entire bottom of the opening.
5. The capacitor as claimed in claim 1 , wherein the first metal layer, the first insulating layer, the oxide semiconductor layer, and the second metal layer are sequentially stacked through the opening of the second insulating layer.
6. An organic light emitting display device, comprising:
an organic light emitting element;
a thin film transistor electrically connected to the organic light emitting element; and
a capacitor electrically connected to the organic light emitting element, the capacitor including:
a first metal layer on a substrate,
a first insulating layer on the first metal layer,
an oxide semiconductor layer on the first insulating layer, the oxide semiconductor layer corresponding to the first metal layer,
a second insulating layer on the first insulating layer, the second insulating layer including a first opening exposing a portion of the oxide semiconductor layer, and
a second metal layer on the second insulating layer and in the first opening, the second metal layer being connected to the exposed portion of the oxide semiconductor layer.
7. The organic light emitting display device as claimed in claim 6 , wherein the second insulating layer covers edge portions of the oxide semiconductor layer and exposes a center portion of the oxide semiconductor layer through the first opening.
8. The organic light emitting display device as claimed in claim 6 , wherein the first metal layer, the first insulating layer, the oxide semiconductor layer, and the second metal layer are sequentially stacked through the first opening of the second insulating layer.
9. The organic light emitting display device as claimed in claim 6 , wherein the thin film transistor includes:
a gate electrode on the substrate, the gate electrode being on a same level as the first metal layer;
an active layer on a same level as the oxide semiconductor layer, the active layer and oxide semiconductor layer including a same material and being positioned on the first insulating layer; and
source-drain electrodes on a same level as the second metal layer, the source-drain electrodes being positioned on the second insulating layer and electrically connected to the active layer through a second opening in the second insulating layer.
10. The organic light emitting display device as claimed in claim 6 , further comprising a passivation layer between the organic light emitting element and each of the thin film transistor and the capacitor, the organic light emitting element being electrically connected to the thin film transistor and the capacitor through the passivation layer.
11. A method of forming an organic light emitting display device, comprising:
forming an organic light emitting element on a substrate;
forming a thin film transistor electrically connected to the organic light emitting element; and
forming a capacitor electrically connected to the organic light emitting element, the capacitor including:
a first metal layer on the substrate,
a first insulating layer on the first metal layer,
an oxide semiconductor layer on the first insulating layer, the oxide semiconductor layer corresponding to the first metal layer,
a second insulating layer on the first insulating layer, the second insulating layer including an opening exposing a portion of the oxide semiconductor layer, and
a second metal layer on the second insulating layer and in the opening, the second metal layer being connected to the exposed portion of the oxide semiconductor layer.
12. The method as claimed in claim 11 , wherein forming the thin film transistor includes forming a gate electrode and an active layer, the gate electrode being formed simultaneously and on a same level as the first metal layer, and the active layer being formed simultaneously and on a same level as the oxide semiconductor layer.
13. The method as claimed in claim 11 , further comprising using plasma to process the exposed portion of the oxide semiconductor layer through the opening of the second insulating layer, such that resistance of the oxide semiconductor layer is reduced.Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.