US8390300B2ActiveUtilityA1

Time domain reflectometry in a coherent interleaved sampling timebase

78
Assignee: EMS STEPHENPriority: Jan 29, 2010Filed: Sep 23, 2010Granted: Mar 5, 2013
Est. expiryJan 29, 2030(~3.6 yrs left)· nominal 20-yr term from priority
G01R 31/11
78
PatentIndex Score
7
Cited by
11
References
12
Claims

Abstract

A system and method for performing a time domain reflectometry measurement. The system includes a coherent interleaved sampling timebase, a sampling strobe generator for generating one or more sampling strobes in accordance with the coherent interleaved sampling timebase, a time domain reflectometry sampling strobe generator for generating one or more time domain reflectometry strobes in accordance with one or more of the generated sampling strobes; and a sampling module for sampling a time domain reflectometry signal in accordance with one or more of the one or more generated sampling strobes and one or more of the one or more generated time domain reflectometry strobes. The system further includes an analog to digital converter for analog to digital converting the samples of the time domain reflectometry signal and a memory for storing the converted samples of the time domain reflectometry signal.

Claims

exact text as granted — not AI-modified
1. A method for performing a time domain reflectometry measurement, comprising the steps of:
 generating a plurality of sampling strobes in accordance with a coherent interleaved sampling timebase; 
 generating a plurality of time domain reflectometry strobes; 
 sampling a TDR waveform in accordance with the generated plurality of sampling strobes and plurality of time domain reflectometry strobes. 
 
     
     
       2. The method of  claim 1 , wherein the plurality of sampling strobes are generated in accordance with a 100 MHz reference clock. 
     
     
       3. The method of  claim 1 , wherein the plurality of time domain reflectometry strobes are generated in accordance with a 100 MHz reference clock. 
     
     
       4. The method of  claim 1 , wherein a number of samples taken of the time domain reflectometry waveform is a function of the sample time. 
     
     
       5. The method of  claim 1 , wherein the frequency of the sampling strobes and the time domain reflectometry strobes are slightly offset relative to each other. 
     
     
       6. The method of  claim 5 , wherein the sampling strobe sweeps over the time domain reflectometry waveform. 
     
     
       7. A system for performing a time domain reflectometry measurement, comprising:
 a coherent interleaved sampling timebase; 
 a sampling strobe generator for generating one or more sampling strobes in accordance with the coherent interleaved sampling timebase; 
 a time domain reflectometry sampling strobe generator for generating one or more time domain reflectometry strobes in accordance with one or more of the generated sampling strobes; 
 a sampling module for sampling a time domain reflectometry signal in accordance with one or more of the one or more generated sampling strobes and one or more of the one or more generated time domain reflectometry strobes; 
 an analog to digital converter for analog to digital converting the samples of the time domain reflectometry signal; and 
 a memory for storing the converted samples of the time domain reflectometry signal. 
 
     
     
       8. The system of  claim 7 , wherein the plurality of sampling strobes are generated in accordance with a 100 MHz reference clock. 
     
     
       9. The system of  claim 7 , wherein the plurality of time domain reflectometry strobes are generated in accordance with a 100 MHz reference clock. 
     
     
       10. The system of  claim 7 , wherein a number of samples taken of the time domain reflectometry waveform is a function of the sample time. 
     
     
       11. The system of  claim 7 , wherein the frequency of the sampling strobes and the time domain reflectometry strobes are slightly offset relative to each other. 
     
     
       12. The system of  claim 11 , wherein the sampling strobe sweeps over the time domain reflectometry waveform.

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