Time domain reflectometry in a coherent interleaved sampling timebase
Abstract
A system and method for performing a time domain reflectometry measurement. The system includes a coherent interleaved sampling timebase, a sampling strobe generator for generating one or more sampling strobes in accordance with the coherent interleaved sampling timebase, a time domain reflectometry sampling strobe generator for generating one or more time domain reflectometry strobes in accordance with one or more of the generated sampling strobes; and a sampling module for sampling a time domain reflectometry signal in accordance with one or more of the one or more generated sampling strobes and one or more of the one or more generated time domain reflectometry strobes. The system further includes an analog to digital converter for analog to digital converting the samples of the time domain reflectometry signal and a memory for storing the converted samples of the time domain reflectometry signal.
Claims
exact text as granted — not AI-modified1. A method for performing a time domain reflectometry measurement, comprising the steps of:
generating a plurality of sampling strobes in accordance with a coherent interleaved sampling timebase;
generating a plurality of time domain reflectometry strobes;
sampling a TDR waveform in accordance with the generated plurality of sampling strobes and plurality of time domain reflectometry strobes.
2. The method of claim 1 , wherein the plurality of sampling strobes are generated in accordance with a 100 MHz reference clock.
3. The method of claim 1 , wherein the plurality of time domain reflectometry strobes are generated in accordance with a 100 MHz reference clock.
4. The method of claim 1 , wherein a number of samples taken of the time domain reflectometry waveform is a function of the sample time.
5. The method of claim 1 , wherein the frequency of the sampling strobes and the time domain reflectometry strobes are slightly offset relative to each other.
6. The method of claim 5 , wherein the sampling strobe sweeps over the time domain reflectometry waveform.
7. A system for performing a time domain reflectometry measurement, comprising:
a coherent interleaved sampling timebase;
a sampling strobe generator for generating one or more sampling strobes in accordance with the coherent interleaved sampling timebase;
a time domain reflectometry sampling strobe generator for generating one or more time domain reflectometry strobes in accordance with one or more of the generated sampling strobes;
a sampling module for sampling a time domain reflectometry signal in accordance with one or more of the one or more generated sampling strobes and one or more of the one or more generated time domain reflectometry strobes;
an analog to digital converter for analog to digital converting the samples of the time domain reflectometry signal; and
a memory for storing the converted samples of the time domain reflectometry signal.
8. The system of claim 7 , wherein the plurality of sampling strobes are generated in accordance with a 100 MHz reference clock.
9. The system of claim 7 , wherein the plurality of time domain reflectometry strobes are generated in accordance with a 100 MHz reference clock.
10. The system of claim 7 , wherein a number of samples taken of the time domain reflectometry waveform is a function of the sample time.
11. The system of claim 7 , wherein the frequency of the sampling strobes and the time domain reflectometry strobes are slightly offset relative to each other.
12. The system of claim 11 , wherein the sampling strobe sweeps over the time domain reflectometry waveform.Cited by (0)
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