Low temperature plasma probe and methods of use thereof

Abstract

The present invention generally relates to a low temperature plasma probe for desorbing and ionizing at least one analyte in a sample material and methods of use thereof. In one embodiment, the invention generally relates to a low temperature plasma probe including: a housing having a discharge gas inlet port, a probe tip, two electrodes, and a dielectric barrier, in which the two electrodes are separated by the dielectric barrier, in which application of voltage from a power supply generates a low temperature plasma, and in which the low temperature plasma is propelled out of the discharge region by the electric field and/or the discharge gas flow.

What is claimed is: 
     
       1. A low temperature plasma probe comprising: a housing comprising a discharge gas inlet port, a probe tip, two electrodes, and a dielectric barrier, wherein the two electrodes are separated by the dielectric barrier, and wherein application of voltage to the two electrodes from a power supply generates an electric field and a low temperature plasma, wherein the electric field produced by the two electrodes propels the low temperature plasma out of the probe tip. 
     
     
       2. The probe according to  claim 1 , wherein a discharge gas is supplied to the probe through the discharge gas inlet port, and the discharge gas assists the electric field in propelling the low temperature plasma out of the probe tip. 
     
     
       3. The probe according to  claim 1 , wherein the dielectric barrier is composed of an electrically insulating material. 
     
     
       4. The probe according to  claim 1 , wherein the dielectric barrier is a glass tube that is open at each end. 
     
     
       5. The low temperature plasma probe according to  claim 1 , wherein the first electrode is grounded and the second electrode receives voltage from the power supply, and application of the voltage from the power supply to the second electrode generates the electric field and the low temperature plasma. 
     
     
       6. The low temperature plasma probe according to  claim 1 , wherein the second electrode is grounded and the first electrode receives voltage from the power supply, and application of the voltage from the power supply to the first electrode generates the electric field and the low temperature plasma. 
     
     
       7. A system for analyzing a sample material comprising: a low temperature plasma probe according to  claim 1  and a mass analyzer. 
     
     
       8. The system according to  claim 7 , wherein the mass analyzer is selected from the group consisting of a mass spectrometer or an ion mobility spectrometer. 
     
     
       9. The system according to  claim 7 , wherein the apparatus for generating low temperature plasma and the mass analyzer are coupled to each other. 
     
     
       10. The system according to  claim 7 , wherein the apparatus for generating low temperature plasma and the mass analyzer are uncoupled, and wherein the mass analyzer is located in sufficiently close proximity from the sample to collect ions of at least one analyte in the sample produced by the apparatus for generating the low temperature plasma.