Analyzer of ultrasonic flaw detection image

Abstract

A flaw detection image analyzer ( 10 ) takes in an inspection procedure command stored in a flaw detection condition database ( 40 ), takes in a flaw detection image signal corresponding to a flaw detection image indicated by the taken inspection procedure command from a database ( 50 ) for flaw detection image signal, and displays the flaw detection image based on the flaw detection image signal on a display ( 30 ), with a display range and a contrast indicated by the inspection procedure command in an arrangement pattern of image indicated by the inspection procedure command. Consequently, optimum images can be displayed sequentially with optimum arrangement pattern, optimum display range and contrast according to a flaw to be inspected when a flaw is detected by observing an ultrasonic flaw detection image.

The invention claimed is: 
     
       1. An analytical apparatus for an ultrasonic flaw detection image, comprising:
 a flaw detection image signal database division storing a plurality of flaw detection image signals obtained by signal transformation of an identical flaw detection waveform signal by a plurality of different signal transformation techniques; 
 a flaw detection condition database division storing a flaw detection condition database constructed from many inspection procedure commands arranged in order of execution, the inspection procedure commands having, as information, a type of a defect to be inspected for, a flaw detection image used in accordance with the type of the defect to be inspected for, an arrangement pattern of the flaw detection image used, a display range showing a range of an image region displayed among image regions of the flaw detection image used, and contrast indicated values defining a contrast of an image in the display range; and 
 a flaw detection image analyzer, 
 wherein the flaw detection image analyzer 
 captures the inspection procedure commands of the flaw detection condition database sequentially based on input commands from an outside, 
 whenever the inspection procedure command is captured, captures from the flaw detection image signal database division the flaw detection image signal corresponding to the flaw detection image indicated by the captured inspection procedure command, and 
 allows a display device to display the flaw detection image based on the flaw detection image signal in the arrangement pattern of the image indicated by the inspection procedure command, in the display range indicated by the inspection procedure command, and with the contrast indicated by the inspection procedure command.