US8753987B2ActiveUtilityPatentIndex 82
Method of manufacturing metal oxide film
Est. expiryJun 8, 2030(~3.9 yrs left)· nominal 20-yr term from priority
H10P 14/3434H10P 14/265C03C 2217/219C01G 31/02C01G 39/02C03C 2218/119C01G 25/02B05D 3/007C03C 2218/116C01G 23/047C03C 2217/218C03C 2217/42C03C 2217/228C03C 17/006C01G 27/02C03C 2217/214C03C 2217/22C01G 33/00C01G 35/00C03C 2217/212C01F 7/02C01F 17/235C01F 17/212C01G 41/02C01F 17/224C01F 17/229C01F 17/218
82
PatentIndex Score
9
Cited by
31
References
17
Claims
Abstract
Provided is a method of manufacturing a metal oxide film to be formed through the following processes: a coating process of forming a coating film on a substrate by using a coating liquid for forming metal oxide film containing any of various organometallic compounds; a drying process of making the coating film into a dried coating film; and a heating process of forming an inorganic film from the dried coating film under an oxygen-containing atmosphere having a dew-point temperature equal to or lower than −10° C.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. A method of manufacturing a metal oxide film to be formed through the following processes:
a coating process of coating a substrate with a coating liquid for forming metal oxide film containing an organometallic compound as a main component to form a coating film;
a drying process of drying the coating film to form a dried coating film; and
a heating process of mineralizing the dried coating film to form an inorganic film having an inorganic component, which is a metal oxide, as a main component,
wherein
the heating process is a process of performing a heating treatment to elevate a temperature of the dried coating film, which has the organometallic compound as a main component and has been formed in the drying process, up to a temperature or higher at which at least mineralization of the organometallic compound components occurs, under an oxygen-containing atmosphere having a dew-point temperature equal to or lower than −10° C., and then removing an organic component contained in the dried coating film by thermal decomposition, burning, or thermal decomposition and burning, thereby forming a metal oxide fine-particle layer densely packed with metal oxide fine particles having a metal oxide as a main component, and
the organometallic compound is formed of any one or more types of an organic aluminum compound, an organic silicon compound, an organic scandium compound, an organic titanium compound, an organic vanadium compound, an organic chromium compound, an organic manganese compound, an organic iron compound, an organic cobalt compound, an organic nickel compound, an organic copper compound, an organic gallium compound, an organic germanium compound, an organic yttrium compound, an organic zirconium compound, an organic niobium compound, an organic molybdenum
compound, an organic ruthenium compound, an organic antimony compound, an organic lanthanum compound, an organic hafnium compound, an organic tantalum compound, an organic tungsten compound, an organic bismuth compound, an organic cerium compound, an organic neodymium compound, an organic samarium compound, an organic gadolinium compound, an organic magnesium compound, an organic calcium compound, an organic strontium compound, and an organic barium compound; and the metal oxide is any one or more types of aluminum oxide, silicon oxide, scandium oxide, titanium oxide, vanadium oxide, chromium oxide, manganese oxide, iron oxide, cobalt oxide, nickel oxide, copper oxide, gallium oxide, germanium oxide, yttrium oxide, zirconium oxide, niobium oxide, molybdenum oxide, ruthenium oxide, antimony oxide, lanthanum oxide, hafnium oxide, tantalum oxide, tungsten oxide, bismuth oxide, cerium oxide, neodymium oxide, samarium oxide, gadolinium oxide, magnesium oxide, calcium oxide, strontium oxide, and barium oxide.
2. The method of manufacturing the metal oxide film according to claim 1 , wherein
subsequently to the heating treatment to elevate the temperature up to the heating temperature or higher at which at least mineralization of the organometallic compound occurs, under the oxygen-containing atmosphere having the dew-point temperature equal to or lower than −10° C., a further heating treatment is performed under an oxygen-containing atmosphere having a dew-point temperature equal to or higher than 0° C.
3. The method of manufacturing the metal oxide film according to claim 1 , wherein
subsequently to the heating treatment to elevate the temperature up to the heating temperature or higher at which at least mineralization of the organometallic compound occurs, under the oxygen-containing atmosphere having the dew-point temperature equal to or lower than −10° C., a further heating treatment is performed under a neutral atmosphere or a reducing atmosphere.
4. The method of manufacturing the metal oxide film according to claim 2 , wherein
subsequently to the heating treatment under the oxygen-containing atmosphere having the dew-point temperature equal to or higher than 0° C., a further heating treatment is performed under a neutral atmosphere or a reducing atmosphere.
5. The method of manufacturing the metal oxide film according to claim 3 , wherein
the neutral atmosphere is an atmosphere containing any one or more types of a nitrogen gas and an inert gas, or the reducing atmosphere is a hydrogen gas atmosphere or an atmosphere containing at least one or more types of hydrogen gas or organic solvent vapor in the neutral atmosphere.
6. The method of manufacturing the metal oxide film according to claim 1 , wherein
the dew-point temperature of the oxygen-containing atmosphere in the heating treatment under the oxygen-containing atmosphere is equal to or lower than −20° C.
7. The method of manufacturing the metal oxide film according to claim 1 , wherein
when the heating treatment under the oxygen-containing atmosphere having the dew-point temperature equal to or lower than −10° C. is performed, energy ray irradiation is performed.
8. The method of manufacturing the metal oxide film according to claim 7 , wherein
the energy ray irradiation is irradiation of ultraviolet rays including at least a component having a wavelength equal to or smaller than 200 nm as a main component.
9. The method of manufacturing the metal oxide film according to claim 8 , wherein
the irradiation of the ultraviolet rays including at least the component having the wavelength equal to or smaller than 200 nm as the main component is irradiation of ultraviolet rays emitted from any of a low-pressure mercury lamp, an amalgam lamp, or an excimer lamp.
10. The method of manufacturing the metal oxide film according to claim 1 , wherein
the organometallic compound is an acetylacetonate metal complex compound, a metal alkoxide compound, or the acetylacetonate metal complex compound and the metal alkoxide compound.
11. The method of manufacturing the metal oxide film according to claim 1 , wherein
the coating of the substrate with the coating liquid for forming metal oxide film in the coating process is performed by a method which is any of an inkjet printing method, a screen printing method, a gravure printing method, an offset printing method, a flexor printing method, a dispenser printing method, a slit coating method, a die coating method, a doctor blade coating method, a wire bar coating method, a spin coating method, a dip coating method, and a spray coating method.
12. A metal oxide film obtained by the method of manufacturing the metal oxide film according to claim 1 .
13. An element including a metal oxide fine-particle layer, wherein the metal oxide fine-particle layer is the metal oxide film according to claim 12 .
14. The element according to claim 13 , wherein
the element is a thin-film transistor using the metal oxide fine-particle layer as a gate insulating film of the thin-film transistor.
15. A substrate with a metal oxide film including the metal oxide film on a substrate, wherein
the metal oxide film is the metal oxide film according to claim 12 .
16. A device including a transparent electrode, wherein
the transparent electrode is the substrate with the metal oxide film according to claim 15 .
17. The device according to claim 16 , wherein the device is of one type selected from among a light emitting device, an electric power generating device, a display device, and an input device.Cited by (0)
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