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US8895331B2ExpiredUtilityPatentIndex 62

Semiconductor light emitting diode having high efficiency and method of manufacturing the same

Assignee: LEE JEONG-WOOKPriority: Dec 8, 2004Filed: Nov 30, 2009Granted: Nov 25, 2014
Est. expiryDec 8, 2024(expired)· nominal 20-yr term from priority
Inventors:LEE JEONG-WOOKSUNG YOUN-JOON
H10H 20/815H10H 20/01335H10H 20/82H01L 33/007H01L 33/12H01L 33/22
62
PatentIndex Score
2
Cited by
24
References
3
Claims

Abstract

Provided is a semiconductor light emitting diode having a textured structure formed on a substrate. In a method of manufacturing the semiconductor light emitting diode, a metal layer is formed on the substrate, and a metal oxide layer having holes is formed by anodizing the metal layer. The metal oxide layer itself can be used as a textured structure pattern, or the textured structure pattern can be formed by forming holes in the substrate or a material layer under the metal oxide layer corresponding to the holes of the metal oxide layer. The manufacture of the semiconductor light emitting diode is completed by sequentially forming a first semiconductor layer, an active layer, and a second semiconductor layer on the textured structure pattern.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A method of manufacturing a semiconductor light emitting diode having a textured structure, the method comprising:
 forming a metal layer on a substrate; 
 forming a metal oxide layer having holes to expose portions of the substrate by anodizing the metal layer; 
 leveling the metal oxide layer to have a desired thickness by removing an upper portion thereof; and 
 sequentially forming a first semiconductor layer, an active layer, and a second semiconductor layer directly on the metal oxide layer, 
 wherein the first semiconductor layer is directly in contact with the metal oxide layer, and the holes are filled with the first semiconductor layer. 
 
     
     
       2. The method of  claim 1 , wherein the substrate is formed of one selected from an inorganic crystal that includes sapphire (Al 2 O 3 ), silicon (Si), silicon carbide (SiC), spinel (MgAl 2 O 4 ), NdGaO 3 , LiGaO 2 , ZnO, or MgO, an III-V group compound semiconductor that includes GaP or GaAs, and an III group nitride compound semiconductor that includes GaN. 
     
     
       3. The method of  claim 1 , wherein the metal layer is formed of a material including Al.

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