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US8939348B2ActiveUtilityPatentIndex 52

Metal bonded structure and metal bonding method

Assignee: SANYO ELECTRIC COPriority: Feb 28, 2011Filed: Feb 19, 2013Granted: Jan 27, 2015
Est. expiryFeb 28, 2031(~4.7 yrs left)· nominal 20-yr term from priority
Inventors:YANASE YASUYUKISAITO KOICHI
H10W 99/00H10W 74/15H10W 72/952H10W 72/9415H10W 72/29H10W 72/019H10W 72/30H10W 72/073H10W 72/07236H10W 72/072H10W 72/241H10W 72/354H10W 90/724H10W 72/252H10W 72/222H10W 72/242H10W 72/012H10W 72/01251H10W 72/01215H10W 72/01255H10W 72/01235H10W 72/01238B32B 15/01B23K 2103/12Y10T428/1291B23K 20/021B32B 7/04B23K 20/02H01L 2224/81447H01L 2924/00014H01L 2924/0665H01L 24/16H01L 2224/16237H01L 2224/1184H01L 2224/05624H01L 2224/1145H01L 2224/0401H01L 2224/11831H01L 224/9211H01L 24/13H01L 2224/2919B23K 2203/12H01L 2224/81191H01L 2224/9211H01L 24/83H01L 2224/1146H01L 2224/0391H01L 2224/81H01L 2924/00013H01L 2224/05599H01L 24/73H01L 2224/73104H01L 2224/11825H01L 2224/8183H01L 2224/83H01L 2924/00H01L 2224/05567H01L 24/32H01L 2224/05099H01L 2924/01029H01L 2224/13147H01L 2224/1148H01L 24/81H01L 24/11H01L 2224/16225H01L 2224/13082H01L 2224/83191H01L 2224/13099H01L 2224/11903
52
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Claims

Abstract

After a microcrystalline layer having a grain size that is finer than that of a base member is formed on the surface of at least one of a first bonding portion and a second bonding portion, the gap between the first bonding portion and the second bonding portion is filled with a solution into which copper oxide can be eluted, so as to deposit copper oxide contained in the surface oxide film into the solution. By applying pressure and by heating at a temperature of at most the copper recrystallization temperature, the components contained in the solution are removed except for copper, so as to elute copper oxide, thereby bonding the first bonding portion and the second bonding portion via the copper thus deposited. Subsequently, the copper is solid-phase diffused into the first bonding portion and the second bonding portion.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A metal bonding method for bonding a first metal and a second metal each including copper as a principal component, the method comprising:
 forming a layer on at least one of the first metal and the second metal, the layer including copper as a principal component and having a copper crystal grain size smaller than that of the first metal and the second metal; 
 after the layer is formed, filling a gap between the first metal and the second metal with a solution into which oxide including a copper oxide is eluted; 
 pressing the first metal and the second metal against each other to reduce the gap after the gap is filled with the solution; and 
 applying heat to the gap to a temperature equal to or lower than a copper recrystallization temperature, with the first metal and the second metal pressed against each other. 
 
     
     
       2. The metal bonding method according to  claim 1 , wherein the layer forming step includes polishing a surface of the at least one of the first metal and the second metal to form the layer on the surface. 
     
     
       3. The metal bonding method according to  claim 1 , wherein the solution is inactive with respect to copper. 
     
     
       4. The metal bonding method according to  claim 2 , wherein the solution is inactive with respect to copper. 
     
     
       5. The metal bonding method according to  claim 1 , wherein the solution contains a ligand that forms a complex with copper. 
     
     
       6. The metal bonding method according to  claim 2 , wherein the solution contains a ligand that forms a complex with copper. 
     
     
       7. The metal bonding method according to  claim 3 , wherein the solution contains a ligand that forms a complex with copper. 
     
     
       8. The metal bonding method according to  claim 5 , wherein the complex is thermally degradable. 
     
     
       9. The metal bonding method according to  claim 6 , wherein the complex is thermally degradable. 
     
     
       10. The metal bonding method according to  claim 7 , wherein the complex is thermally degradable. 
     
     
       11. The metal bonding method according to  claim 1 , wherein the solution is ammonia water or a carboxylic acid aqueous solution. 
     
     
       12. The metal bonding method according to  claim 2 , wherein the solution is configured as ammonia water, or otherwise as a carboxylic acid aqueous solution. 
     
     
       13. The metal bonding method according to  claim 3 , wherein the solution is ammonia water or a carboxylic acid aqueous solution. 
     
     
       14. The metal bonding method according to  claim 4 , wherein the solution is ammonia water, or a carboxylic acid aqueous solution. 
     
     
       15. The metal bonding method according to  claim 5 , wherein the solution is ammonia water or a carboxylic acid aqueous solution. 
     
     
       16. The metal bonding method according to  claim 6 , wherein the solution is ammonia water, or a carboxylic acid aqueous solution. 
     
     
       17. The metal bonding method according to  claim 7 , wherein the solution is ammonia water or a carboxylic acid aqueous solution. 
     
     
       18. The metal bonding method according to  claim 8 , wherein the solution is ammonia water or a carboxylic acid aqueous solution. 
     
     
       19. The metal bonding method according to  claim 9 , wherein the solution is ammonia water or a carboxylic acid aqueous solution. 
     
     
       20. The metal bonding method according to  claim 1 , wherein the layer forming step including performing sputtering to form the layer on the at least one of the first metal and the second metal. 
     
     
       21. The metal bonding method according to  claim 1 , wherein the layer forming step includes performing plating to form the layer on the at least one of the first metal and the second metal. 
     
     
       22. The metal bonding method according to  claim 1 , wherein the layer forming step includes applying strain to a surface of the at least one of the first metal and the second metal to form the layer.

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