Subject information acquisition apparatus and subject information acquisition method

Abstract

A subject information acquisition apparatus includes a first holding member that holds a subject, a probe that receives an elastic wave from the subject through the first holding member, a first holding member deformation amount measuring unit that measures an amount of deformation of the first holding member, and a processing unit that creates an area for generating subject information by using the amount of deformation of the first holding member and position information of the first holding member deformation amount measuring unit and generates an information value of subject information corresponding to the area for generating subject information by using a signal outputted by the probe.

What is claimed is: 
     
       1. A subject information acquisition apparatus comprising:
 a first holding member configured to hold a subject; 
 a probe configured to receive an elastic wave from the subject through the first holding member and generate an output signal; 
 a first holding member deformation amount measuring unit configured to measure an amount of deformation of the first holding member; and 
 a processing unit configured to create an area for generating subject information by using the amount of deformation of the first holding member and position information of the first holding member deformation amount measuring unit and generate an information value of subject information corresponding to the area for generating subject information by using the signal outputted by the probe. 
 
     
     
       2. The subject information acquisition apparatus according to  claim 1 , further comprising:
 a second holding member configured to enclose the subject between the second holding member and the first holding member; and 
 a second holding member deformation amount measuring unit configured to measure an amount of deformation of the second holding member, 
 wherein the processing unit creates the area for generating subject information by using the amount of deformation of the first holding member, position information of the first holding member deformation amount measuring unit, the amount of deformation of the second holding member, position information of the second holding member deformation amount measuring unit, and member-to-member distance information between the first holding member and the second holding member. 
 
     
     
       3. The subject information acquisition apparatus according to  claim 2 , further comprising:
 a compression mechanism configured to drive the first holding member or the second holding member, 
 wherein the compression mechanism includes a member-to-member distance measuring unit configured to measure the member-to-member distance information between the first holding member and the second holding member. 
 
     
     
       4. The subject information acquisition apparatus according to  claim 1 , further comprising a probe scanning mechanism configured to cause the probe to scan along a surface of the first holding member. 
     
     
       5. The subject information acquisition apparatus according to  claim 4 , wherein
 the probe scanning mechanism includes the first holding member deformation amount measuring unit, and 
 the processing unit acquires position information of the first holding member deformation amount measuring unit based on a scanning position of the probe scanning mechanism. 
 
     
     
       6. The subject information acquisition apparatus according to  claim 1 , wherein
 the processing unit calculates a local gradient of the first holding member from the area for generating subject information, and 
 the processing unit calculates refraction of an elastic wave generated in an interface between the subject and the first holding member according to Snell's law and identifies a position in the area for generating subject information from which an elastic wave that generates a signal received by the probe is transmitted. 
 
     
     
       7. The subject information acquisition apparatus according to  claim 1 , further comprising:
 a matching material filled between the first holding member and the probe, 
 wherein the processing unit calculates refraction of an elastic wave generated in an interface between the first holding member and the matching material according to Snell's law and identifies a position in the area for generating subject information from which an elastic wave that generates a signal received by the probe is transmitted. 
 
     
     
       8. The subject information acquisition apparatus according to  claim 1 , wherein the first holding member deformation amount measuring unit is attached directly to a plurality of positions on the first holding member or a first fixing member that fixes the first holding member. 
     
     
       9. The subject information acquisition apparatus according to  claim 1 , wherein the second holding member deformation amount measuring unit is attached directly to a plurality of positions on the second holding member or a second fixing member that fixes the second holding member. 
     
     
       10. A subject information acquisition method comprising:
 a step of receiving an elastic wave from a subject through a first holding member by a probe and outputting a signal; 
 a step of acquiring, by a first holding member deformation amount measuring unit, distribution information of amounts of deformation of the first holding member; 
 a step of creating an area for acquiring subject information based on the distribution information of amounts of deformation of the first holding member and position information of the first holding member deformation amount measuring unit; and 
 a step of generating an information value of subject information corresponding to the area for acquiring subject information from the signal outputted by the probe.