System and method utilizing time-slice-eradication to eliminate the effects of wavelength non-linearities from swept-wavelength testing of optical components for sources with non-linearities

Abstract

A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.

What is claimed is: 
     
       1. A method of correcting a non-linearity in a tunable laser source, the method comprising:
 directing electromagnetic radiation over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths; 
 monitoring the electromagnetic radiation emitted over the range of wavelengths; 
 determining a non-linearity in one or more wavelengths over the range of wavelengths; and 
 transmitting a signal to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source. 
 
     
     
       2. The method of  claim 1 , wherein data is collected in an array of data. 
     
     
       3. The method of  claim 2 , wherein data occurring at the non-linearity is replaced with sampled data occurring prior to the non-linearity. 
     
     
       4. The method of  claim 2 , wherein data occurring at the non-linearity is replaced with data consistent with data immediately prior to the non-linearity. 
     
     
       5. The method of  claim 1 , wherein the tunable laser source is a semiconductor monolithic tunable laser source. 
     
     
       6. A method for collecting data from a tunable laser source having one or more nonlinearities occurring when the tunable laser source is swept over a range of wavelengths, the method comprising:
 directing electromagnetic radiation from the tunable laser source over the range of wavelengths to a measurement system, wherein the measurement system collects data over the range of wavelengths; 
 determining one or more non-nonlinearities in the collected data; and 
 storing the one or more non-linearities in an electronic storage device communicatively coupled to the measurement system. 
 
     
     
       7. The method of  claim 6  further comprising directing the electromagnetic radiation over the range of wavelengths and through a device under test. 
     
     
       8. The method of  claim 7  further comprising collecting device under test data over the range of wavelengths. 
     
     
       9. The method of  claim 8 , wherein the device under test data occurring at the end of one or more non-nonlinearities is replaced with device under test data immediately prior to the one or more non-linearities. 
     
     
       10. The method of  claim 7  further comprising providing a control signal to the measurement system, wherein the control signal is operative to instruct the measurement system not to acquire device under test data occurring at the one or more non-linearities. 
     
     
       11. A system for correcting data based on a non-linearity in a tunable laser source, the system comprising:
 a tunable laser source for directing incident electromagnetic energy over a range of wavelengths; 
 a measurement system for detecting electromagnetic radiation from the tunable laser source; 
 a storage device communicatively coupled to the measurement system for storing data representative of one or more optical characteristics associated with wavelength of the incident electromagnetic energy detected by the measurement system; and a processor communicatively coupled to the storage device, wherein the processor executes an algorithm for correcting data associated with non-linearities from the tunable laser source. 
 
     
     
       12. The system of  claim 11 , wherein the tunable laser source is a semiconductor monolithic tunable laser source. 
     
     
       13. The system of  claim 11  further including a switch operable in a first position to control the measurement system such that when the tunable laser source is outputting electromagnetic radiation at a wavelength having a non-linearity, the switch disengages the measurement system from collecting data. 
     
     
       14. The system of  claim 13 , wherein the switch is operable in a second position to allow the measurement system to collect information when the tunable laser source is outputting electromagnetic radiation at a wavelength having a linearity. 
     
     
       15. The system of  claim 11 , wherein the algorithm replaces data consistent with data immediately prior to a detected non-linearity.