Test method for an escape route marking

Abstract

A testing method for an escape path marking which has an installation position and is illuminated by a light source located in a defined position relative to the installation position, in order to charge the escape path marking for achieving afterglow, the following steps: An excitation curve A (λ) for the escape path marking is provided; the irradiance E (λ) of the light source is recorded for the installation position of the escape path marking; a weighted irradiance B (λ) is determined as a product of the irradiance and the excitation curve; a charging irradiance (BiL) is determined as an integral over the weighted irradiance across the wavelength; and a characteristic curve K t1 (BiL) depending upon the charging time t 1 specifies what afterglow time emerges for the escape path marking with the charging time t 1 for the charging irradiance (BiL).

The invention claimed is: 
     
       1. A testing method for an escape path marking which has an installation position and is illuminated by a light source in a defined position relative to the installation position, in order to charge the escape path marking for achieving afterglow, the method comprising the following steps:
 An excitation curve A (λ)for the escape path marking is provided, depending upon a wavelength; 
 an irradiance E (λ)of the light source is recorded for the installation position of the escape path marking, depending upon the wavelength; 
 a weighted irradiance B (λ)is determined as a product of the irradiance and the excitation curve, depending upon the wavelength; 
 a charging irradiance (BiL) is determined as an integral over the weighted irradiance across the wavelength; and 
 a characteristic curve K t1  (BiL) depending upon the charging time t 1  specifies what afterglow time emerges for the escape path marking with a charging time t 1  for the charging irradiance (BiL). 
 
     
     
       2. The testing method according to  claim 1 , wherein the irradiance E (λ) of the light source is multiplied by a transmission spectrum T (λ) of a colour filter of the escape path marking. 
     
     
       3. The testing method according to  claim 1 , wherein the characteristic curve K t1  (BiL) is ascertained by measuring the associated afterglow time for multiple charging irradiances (BiL) and respectively using it as a support point of the characteristic curve. 
     
     
       4. The testing method according to  claim 3 , wherein a set of characteristic curves K t1  (BiL) is ascertained for multiple charging times. 
     
     
       5. The testing method in accordance with  claim 3 , wherein the light source is light-emitting diodes, the irradiance of which can be set to determine the characteristic curve in order to achieve different charging irradiances. 
     
     
       6. The testing method according to  claim 1 , wherein an excitation curve A pig  (λ) of the luminescent pigments in the escape path marking is used as the excitation curve A (λ)for the escape path marking. 
     
     
       7. The testing method according to  claim 1 , wherein the irradiance E (λ) is measured with a spectrometer. 
     
     
       8. The testing method according to  claim 7 , wherein the irradiance E (λ) is determined for a mean distance between the light source and the escape path marking. 
     
     
       9. The testing method of  claim 1  further providing a computer, wherein the computer has a data input, in order to read the excitation curve A (λ), the weighted irradience B (λ), the charging time t 1  and a set of characteristic curves K t1  (BiL), and a data output for the afterglow time resulting. 
     
     
       10. The testing method of  claim 9 , wherein the data input is configured to read a transmission spectrum T (λ) of a color filter of the escape path marking. 
     
     
       11. A spectrometer for testing an escape path marking which has an installation position and is illuminated by a light source located in a defined position relative to the installation position, in order to charge the escape path marking for achieving afterglow, wherein the spectrometer comprises:
 a memory for accumulating an excitation curve A (λ) for the escape path marking, depending upon a wavelength; 
 a spectral measuring device, which records irradiance of the light source for the installation position of the escape path marking, depending upon the wavelength; a further memory for accumulating a weighted irradiance B (λ), as well as a means of multiplying the irradiance and the excitation curve; integration means, which access the further memory to integrate the accumulated irradiance over the wavelength and thus determine a charging irradiance (BiL); and 
 evaluation means having a set of characteristic curves K t1  (BiL) depending upon a charging time t 1 , wherein one of the characteristic curves K t1  (BiL) specifies an afterglow time for the escape path marking with the charging time t 1  for the charging irradiance (BiL) ascertained by the integration means. 
 
     
     
       12. The spectrometer according to  claim 11 , wherein further means of multiplying the irradiance of the light source E (λ) by a transmission spectrum T(λ) of a colour filter of the escape path marking are provided.