US9311989B2ActiveUtilityA1

Power gate for latch-up prevention

55
Assignee: TEXAS INSTRUMENTS INCPriority: Jul 15, 2014Filed: Jul 15, 2014Granted: Apr 12, 2016
Est. expiryJul 15, 2034(~8 yrs left)· nominal 20-yr term from priority
G11C 11/4074G11C 11/412G11C 5/148G11C 11/417
55
PatentIndex Score
1
Cited by
6
References
6
Claims

Abstract

In an embodiment of the invention, power is provided to an SRAM array without causing latch-up by charging the positive voltage node in the SRAM array and the Nwell regions in the SRAM at approximately the same rate.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A circuit for providing power to a static random access memory (SRAM) array without causing latch-up comprising:
 a first PFET, the first PFET having a source, a drain and a gate wherein the drain of the first PFET is connected to a positive voltage node in the SRAM array, the source of the first PFET is connected to a first power supply and the gate of the first PFET is connected to a first control signal; 
 a second PFET, the second PFET having a source, a drain and a gate wherein the drain of the second PFET is connected to at least one Nwell in the SRAM array, the source of the second PFET is connected to a second power supply and the gate of the second PFET is connected to the first control signal; and 
 a third PFET, the third PFET having a source, a drain and a gate wherein the drain of the third PFET is connected to the least one Nwell in the SRAM array, the source of the third PFET is connected to the positive voltage node in the SRAM array and the gate of the third PFET is connected to a second control signal. 
 
     
     
       2. The circuit of  claim 1  wherein the second control signal is driven to a logical low level before the first control signal is driven to a logical low level. 
     
     
       3. The circuit of  claim 1  wherein the first and second control signals are driven to a logical low level at approximately the same time. 
     
     
       4. A circuit for providing power to a static random access memory (SRAM) array without causing latch-up comprising:
 a first PFET, the first PFET having a source, a drain and a gate wherein the drain of the first PFET is connected to a positive voltage node in the SRAM array, the source of the first PFET is connected to a first power supply and the gate of the first PFET is connected to a first control signal; 
 a second PFET, the second PFET having a source, a drain and a gate wherein the drain of the second PFET is connected to all Nwells in the SRAM array, the source of the second PFET is connected to a second power supply and the gate of the second PFET is connected to the first control signal; and 
 a third PFET, the third PFET having a source, a drain and a gate wherein the drain of the third PFET is connected to all Nwells in the SRAM array, the source of the third PFET is connected to the positive voltage node in the SRAM array and the gate of the third PFET is connected to a second control signal. 
 
     
     
       5. The circuit of  claim 1  wherein the second control signal is driven to a logical low level before the first control signal is driven to a logical low level. 
     
     
       6. The circuit of  claim 1  wherein the first and second control signals are driven to a logical low level at approximately the same time.

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